"A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs ..."

Koji Nii et al. (2012)

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DOI: 10.1109/ATS.2012.59

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Koji Nii, Yasumasa Tsukamoto, Yuichiro Ishii, Makoto Yabuuchi, Hidehiro Fujiwara, Kazuyoshi Okamoto:
A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues. Asian Test Symposium 2012: 246-251

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