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- Dhooghe SNikova S(2023)The Random Fault ModelSelected Areas in Cryptography – SAC 202310.1007/978-3-031-53368-6_10(191-212)Online publication date: 14-Aug-2023
- Baig MChakraborty SDziembowski SGałązka MLizurej TPietrzak K(2023)Efficiently Testable Circuits Without ConductivityTheory of Cryptography10.1007/978-3-031-48621-0_5(123-152)Online publication date: 29-Nov-2023
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