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Formal reliability and failure analysis of ethernet based communication networks in a smart grid substation

Published: 01 February 2020 Publication History

Abstract

Secure and continuous operation of a smart grid substation mainly depends upon the reliable functioning of its communication network. The communication system of a smart substation is typically based on a high performance Ethernet communication network that connects various intelligent embedded devices, such as Intelligent Electronic Devices (IED) andMerging Units (MU), to ensure continuous monitoring, automation and efficient demand response of the smart substation. Traditionally, Reliability Block Diagram (RBD) and Fault Tree (FT) methods are used to develop reliability and failure models for these communication networks by considering the failure characteristics of their substation intelligent embedded devices and other components, like transformers and circuit breakers. These resulting reliability and failure models are then analyzed using paper-and-pencil methods or computer simulations, but they cannot assure accuracy in the analysis due to their inherent limitations. As an accurate alternative, we propose a methodology, based on higher-order logic theorem proving, for conducting the formal RBD and FT-based reliability and failure analysis of smart substation communication networks, respectively. This paper also describes a sound transformation of smart grid FT models to their equivalent RBDs - a well-known method to reduce the complexity of FT-based failure analysis. Some ML-based tactics have been developed to automatically compute the reliability and failure probability of smart grid substations for practical purposes.

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              Published In

              cover image Formal Aspects of Computing
              Formal Aspects of Computing  Volume 32, Issue 1
              Feb 2020
              150 pages
              ISSN:0934-5043
              EISSN:1433-299X
              Issue’s Table of Contents

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              Springer-Verlag

              Berlin, Heidelberg

              Publication History

              Published: 01 February 2020
              Accepted: 23 December 2019
              Received: 27 April 2019
              Published in FAC Volume 32, Issue 1

              Author Tags

              1. Smart grid
              2. Reliability block diagrams
              3. Fault tree
              4. Higher-order logic
              5. Theorem proving

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