article

Original paper: Development of a method using multispectral imagery and spatial pattern metrics to quantify stress to wheat fields caused by Diuraphis noxia

Authors:

Georges F. Backoulou,

Norman C. Elliott,

Kristopher Giles,

Vasile CatanaAuthors Info & Claims

Computers and Electronics in Agriculture, Volume 75, Issue 1

Pages 64 - 70

https://doi.org/10.1016/j.compag.2010.09.011

Published: 01 January 2011 Publication History

Abstract

The Russian wheat aphid, Diuraphis noxia, is an important pest of winter wheat, Triticum aestivum, and barley, Hordeum vulgare that has caused an annual economic loss estimated at over 1 billion dollars since it first appeared in the United States. The objective of this study was to determine the potential of combining multispectral imagery with spatial pattern recognition to identify and spatially differentiate D. noxia infestations in wheat fields. Multispectral images were acquired using an MS3100-CIR multispectral camera. D. noxia, drought, and agronomic conditions were identified as major causes for stresses found in wheat fields. Seven spatial metrics were computed for each stress factor. The analysis of spatial metrics quantitatively differentiated the three types of stress found within wheat fields. Detection and differentiation of wheat field stress may help in mapping stress and may have implications for site-specific monitoring systems to identify D. noxia infestations and help to target pesticide applications.

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Cited By

Rodriguez-Moreno FZemek FKren JPikl MLukas VNovak J(2016)Spectral monitoring of wheat canopy under uncontrolled conditions for decision making purposesComputers and Electronics in Agriculture10.1016/j.compag.2016.05.002125:C(81-88)Online publication date: 1-Jul-2016
https://dl.acm.org/doi/10.1016/j.compag.2016.05.002
Huang SQi LMa XXue KWang WZhu X(2015)Hyperspectral image analysis based on BoSW model for rice panicle blast gradingComputers and Electronics in Agriculture10.1016/j.compag.2015.08.031118:C(167-178)Online publication date: 1-Oct-2015
https://dl.acm.org/doi/10.1016/j.compag.2015.08.031
Backoulou GElliott NGiles KMirik M(2015)Processed multispectral imagery differentiates wheat crop stress caused by greenbug from other causesComputers and Electronics in Agriculture10.1016/j.compag.2015.05.008115:C(34-39)Online publication date: 1-Jul-2015
https://dl.acm.org/doi/10.1016/j.compag.2015.05.008
Show More Cited By

Index Terms

Original paper: Development of a method using multispectral imagery and spatial pattern metrics to quantify stress to wheat fields caused by Diuraphis noxia
1. Applied computing
  1. Physical sciences and engineering
    1. Earth and atmospheric sciences
2. Computing methodologies
  1. Artificial intelligence
    1. Computer vision
  2. Computer graphics
    1. Image manipulation
      1. Image processing

Index terms have been assigned to the content through auto-classification.

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cover image Computers and Electronics in Agriculture

Computers and Electronics in Agriculture Volume 75, Issue 1

January, 2011

223 pages

ISSN:0168-1699

Issue’s Table of Contents

Copyright © Elsevier B.V. © 2010.

Publisher

Elsevier Science Publishers B. V.

Netherlands

Publication History

Published: 01 January 2011

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Cited By

Rodriguez-Moreno FZemek FKren JPikl MLukas VNovak J(2016)Spectral monitoring of wheat canopy under uncontrolled conditions for decision making purposesComputers and Electronics in Agriculture10.1016/j.compag.2016.05.002125:C(81-88)Online publication date: 1-Jul-2016
https://dl.acm.org/doi/10.1016/j.compag.2016.05.002
Huang SQi LMa XXue KWang WZhu X(2015)Hyperspectral image analysis based on BoSW model for rice panicle blast gradingComputers and Electronics in Agriculture10.1016/j.compag.2015.08.031118:C(167-178)Online publication date: 1-Oct-2015
https://dl.acm.org/doi/10.1016/j.compag.2015.08.031
Backoulou GElliott NGiles KMirik M(2015)Processed multispectral imagery differentiates wheat crop stress caused by greenbug from other causesComputers and Electronics in Agriculture10.1016/j.compag.2015.05.008115:C(34-39)Online publication date: 1-Jul-2015
https://dl.acm.org/doi/10.1016/j.compag.2015.05.008
Backoulou GElliott NGiles KRao M(2013)Differentiating stress to wheat fields induced by Diuraphis noxia from other stress causing factorsComputers and Electronics in Agriculture10.5555/2749493.275029190:C(47-53)Online publication date: 1-Jan-2013
https://dl.acm.org/doi/10.5555/2749493.2750291
Backoulou GElliott NGiles KPhoofolo MCatana VMirik MMichels J(2011)Spatially discriminating Russian wheat aphid induced plant stress from other wheat stressing factorsComputers and Electronics in Agriculture10.1016/j.compag.2011.06.00578:2(123-129)Online publication date: 1-Sep-2011
https://dl.acm.org/doi/10.1016/j.compag.2011.06.005

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