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Failure Dependent Bandwidth in Shuffle-Exchange Networks

Published: 01 July 1988 Publication History
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  • Abstract

    A failure-dependent bandwidth model for shuffle-exchange (S/E) and augmented shuffle-exchange (S/E+) interconnection networks is presented. The models are based on probabilities of either data or address model failures for the individual binary switches that comprise the network and give the expected bandwidth as a function of the probability of failures in these switches. A model consistent with those previously published for a zero probability of failure is first developed for the S/E network. It is extended to the S/E+ network by developing a special model for the input stage of the S/E+ network and then proving that, to within a close approximation, the conditions necessary for the S/E model hold at the outputs of first stage of the S/E+. The primary uses of the bandwidth models presented are as a network design parameter and as a measure to evaluate the cost effectiveness of proposed, switch-level, reliability enhancement.

    References

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    Published In

    cover image IEEE Transactions on Computers
    IEEE Transactions on Computers  Volume 37, Issue 7
    July 1988
    135 pages

    Publisher

    IEEE Computer Society

    United States

    Publication History

    Published: 01 July 1988

    Author Tags

    1. address model
    2. augmented shuffle-exchange
    3. binary switches
    4. failure dependent bandwidth
    5. fault tolerant computing
    6. interconnection networks
    7. network design parameter
    8. parallel processing.
    9. probability of failures
    10. reliability enhancement
    11. shuffle-exchange networks

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