research-article

Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms

Authors:

Johan Karlsson,

Peter Dahlgren,

Rolf Johansson,

Ulf GunnefloAuthors Info & Claims

IEEE Micro, Volume 14, Issue 1

Pages 8 - 11, 13-23

https://doi.org/10.1109/40.259894

Published: 01 February 1994 Publication History

Abstract

Fault injection is an effective method for studying the effects of faults in computer systems and for validating fault-handling mechanisms. The approach presented involves injecting transient faults into integrated circuits by using heavy-ion radiation from a Californium-252 source. The proliferation of safety-critical and fault-tolerant systems using VLSI technology makes such attempts to inject faults at internal locations in VLSI circuits increasingly important.

References

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1. D. K. Nichols et al., "Update on Parts SEU Susceptibility From Heavy Ions," IEEE Trans. Nuclear Science, Vol. 38, No. 6, IEEE, Piscataway, N.J., 1991, pp. 1529-1539.

[2]

2. R. Harboe-Sorensen, L. Adams, and T.K. Sanderson, "A Summary of SEU Test Results Using Californium-252," IEEE Trans. Nuclear Science, Vol. 35, No. 6, IEEE, 1988, pp. 1622- 1628.

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3. R. Velazco et al., "Comparison Between Californium and Cyclotron SEU Tests," IEEE Trans. Nuclear Science, Vol. 36, No. 6, IEEE, 1989, pp. 2383-2387.

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4. R. Koga et al., "Techniques of Microprocessor Testing and SEU-Rate Prediction," IEEE Trans. Nuclear Science, Vol. 32, No. 6, IEEE, 1985, pp. 4219-4224.

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1. G.C. Messenger, "Collection of Charge on Junction Nodes from Ion Tracks," IEEE Trans. Nuclear Science, Vol. NS-29, No. 6, IEEE, Piscataway, N.J., Dec. 1982, pp. 2024-2031.

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1. J. C. Laprie, "Dependable Computing and Fault-Tolerance: Concepts and Terminology," Proc. 15th Int'l Symp. Fault-Tolerant Computing, IEEE Computer Society Press, Los Alamitos, Calif., 1985, pp. 2-11.

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2. J. Arlat et al., "Fault Injection for Dependability Validation: A Methodology and Some Applications," IEEE Trans. Software Engineering, Vol. 16, No. 2, CS Press, Feb. 1990, pp. 166-182.

Digital Library

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3. J.H. Lala, "Fault Detection, Isolation, and Reconfiguration in FTMP: Methods and Experimental Results," Fifth AIAA/IEEE Digital Avionics Sys. Conf., Nov. 1983, pp. 21.31.1-21.3.9.

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4. A.C. Merenda and E. Merenda, "Recovery/Serviceability System Test: An Improved Testing Approach." Proc. 22nd Int'l Symp. Fault-Tolerant Computing, CS Press, July 1992.

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5. J.H. Barton et al., "Fault Injection Experiments Using FIAT," IEEE Trans. Computers, Vol. 39, No. 4, CS Press, Apr. 1990, pp. 575- 582.

Digital Library

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6. G.A. Kanawati, N.A. Kanawati, and J.A. Abraham, "FERRARI: A Tool for the Validation of System Dependability Properties," Proc. 22nd Int'l Symp. Fault-Tolerant Computing, CS Press, July 1992.

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7. J. Sosnowski, "Experiments with Transient Fault Upsets in Microprocessor Controllers, " Proc. Third GI/ITG/GMA Int'l Conf. Fault-Tolerant Computing Sys., Springer-Verlag, Berlin, Heidelberg, 1987, Sept. 1987, pp. 153-164.

Digital Library

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8. J. Karlsson et al., "Two Fault Injection Techniques for Test of Fault Handling Mechanism," Proc. Int'l Test Conf., Piscataway, N.J., Oct. 1991, pp. 140-149.

Digital Library

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9. J. H. Stephen et al., "Cosmic Ray Simulation Experiments for the Study of Single Event Upsets and Latch-up in CMOS Memories," IEEE Trans. Nuclear Science, Vol. NS-30, No. 6, IEEE, Dec. 1983, pp. 4464-4469.

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10. D. Mapper et al., "An Experimental Study of the Effect of Absorbers on the LET of Fission Particles Emitted by Cf-252," IEEE Trans. Nuclear Science, Vol. NS-32, No. 6, IEEE, Piscataway, N.J., Dec. 1985, pp. 4276-4281.

[16]

11. U. Gunneflo, J. Karlsson, and J. Torin, "Evaluation of Error Detection Schemes Using Fault Injection by Heavy-Ion Radiation," Proc. 19th Int'l Symp. Fault-Tolerant Computing, CS Press, June 1989, pp. 340-347.

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Index Terms

Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms
1. Computer systems organization
  1. Dependable and fault-tolerant systems and networks
2. Hardware

Index terms have been assigned to the content through auto-classification.

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Published In

cover image IEEE Micro

IEEE Micro Volume 14, Issue 1

February 1994

119 pages

ISSN:0272-1732

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Copyright © Copyright © 1994 IEEE. All Rights Reserved.

Publisher

IEEE Computer Society Press

Washington, DC, United States

Publication History

Published: 01 February 1994

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Chiu TXiong W(2023)SoK: Fault Injection Attacks on CryptosystemsProceedings of the 12th International Workshop on Hardware and Architectural Support for Security and Privacy10.1145/3623652.3623671(64-72)Online publication date: 29-Oct-2023
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