Article

On Utilizing Test Cube Properties to Reduce Test Data Volume Further

Authors:

Xijiang Lin,

Jansuz RajskiAuthors Info & Claims

ATS '12: Proceedings of the 2012 IEEE 21st Asian Test Symposium

Pages 83 - 88

https://doi.org/10.1109/ATS.2012.41

Published: 19 November 2012 Publication History

Abstract

Test data compression has become a dominant approach to reduce the test cost today. Majority of test compression schemes are based on the fact that the generated test cubes have very few specified bits. This paper studies additional test cube properties and utilizes them to reduce the test data volume (TDV) further. Two approaches are proposed in this paper. The first one requires no additional hardware and the second one is based on the new DFT hardware, named background chains. The proposed approaches can be combined with other test compression schemes to achieve additional TDV reduction. The experimental results based on embedded deterministic test (EDT) show the proposed approaches achieve significant TDV reduction for industrial designs.

Cited By

View all

Addepalli HPomeranz ISavidis ISasan AThapliyal HDeMara R(2022)Algorithms for the Selection of Applied Tests when a Stored Test Produces Many Applied TestsProceedings of the Great Lakes Symposium on VLSI 202210.1145/3526241.3530359(345-349)Online publication date: 6-Jun-2022
https://dl.acm.org/doi/10.1145/3526241.3530359
Pomeranz I(2018)Partially Invariant Patterns for LFSR-Based Generation of Close-to-Functional Broadside TestsACM Transactions on Design Automation of Electronic Systems10.1145/320140523:4(1-18)Online publication date: 29-May-2018
https://dl.acm.org/doi/10.1145/3201405
Pomeranz I(2017)Computation of Seeds for LFSR-Based n-Detection Test GenerationACM Transactions on Design Automation of Electronic Systems10.1145/299414422:2(1-13)Online publication date: 4-Jan-2017
https://dl.acm.org/doi/10.1145/2994144
Show More Cited By

Recommendations

Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data
ATS '11: Proceedings of the 2011 Asian Test Symposium

A new test application scheme is proposed for low-power scan testing, which is able to compress test data significantly. A combination of a scan architecture and an existent test compression scheme can compress test data even better. Test power can be ...
A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips
VTS '08: Proceedings of the 26th IEEE VLSI Test Symposium

Conventional methods to assess the test data volume (TDV) of logic in system-on-chips (SoCs) use intuitive formulae that are often agnostic of the target automatic test equipment (ATE) hardware or the ATE test program compilation process. In this paper, ...
On don't cares in test compression

Both test compression tools and ATPGs directly producing compressed test greatly benefit from don't care values present in the test. Actually, presence of these don't cares is essential for success of the compression. Contemporary ATPGs produce tests ...

Comments

Information & Contributors

Information

Published In

ATS '12: Proceedings of the 2012 IEEE 21st Asian Test Symposium

November 2012

354 pages

ISBN:9780769548760

Publisher

IEEE Computer Society

United States

Publication History

Published: 19 November 2012

Author Tags

Qualifiers

Article

Contributors

Other Metrics

View Article Metrics

Bibliometrics & Citations

Bibliometrics

Article Metrics

6
Total Citations
View Citations
0
Total Downloads

Downloads (Last 12 months)0
Downloads (Last 6 weeks)0

Reflects downloads up to 04 Oct 2024

Other Metrics

View Author Metrics

Citations

Cited By

View all

Addepalli HPomeranz ISavidis ISasan AThapliyal HDeMara R(2022)Algorithms for the Selection of Applied Tests when a Stored Test Produces Many Applied TestsProceedings of the Great Lakes Symposium on VLSI 202210.1145/3526241.3530359(345-349)Online publication date: 6-Jun-2022
https://dl.acm.org/doi/10.1145/3526241.3530359
Pomeranz I(2018)Partially Invariant Patterns for LFSR-Based Generation of Close-to-Functional Broadside TestsACM Transactions on Design Automation of Electronic Systems10.1145/320140523:4(1-18)Online publication date: 29-May-2018
https://dl.acm.org/doi/10.1145/3201405
Pomeranz I(2017)Computation of Seeds for LFSR-Based n-Detection Test GenerationACM Transactions on Design Automation of Electronic Systems10.1145/299414422:2(1-13)Online publication date: 4-Jan-2017
https://dl.acm.org/doi/10.1145/2994144
Pomeranz I(2017)LFSR-Based Generation of Multicycle TestsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2016.258768736:3(503-507)Online publication date: 1-Mar-2017
https://dl.acm.org/doi/10.1109/TCAD.2016.2587687
Pomeranz I(2016)Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside TestsACM Transactions on Design Automation of Electronic Systems10.1145/291198322:1(1-22)Online publication date: 27-May-2016
https://dl.acm.org/doi/10.1145/2911983
Pomeranz I(2016)N-Detection Test Sets for Circuits with Multiple Independent Scan ChainsACM Transactions on Design Automation of Electronic Systems10.1145/289751421:4(1-15)Online publication date: 18-May-2016
https://dl.acm.org/doi/10.1145/2897514

View Options

View options

Get Access

Login options

Check if you have access through your login credentials or your institution to get full access on this article.

Abstract

Cited By

Recommendations

Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data

A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips

On don't cares in test compression

Comments

Information

Published In

Publisher

Publication History

Author Tags

Qualifiers

Contributors

Other Metrics

Bibliometrics

Article Metrics

Other Metrics

Citations

Cited By

View options

Get Access

Login options

Full Access

Figures

Other

Share

Share this Publication link

Share on social media

Affiliations