Combined Impact of NBTI Aging and Process Variations on Noise Margins of Flip-Flops
Abstract
Index Terms
- Combined Impact of NBTI Aging and Process Variations on Noise Margins of Flip-Flops
Recommendations
Design and Simulation for NBTI Aware Logic Gates
AbstractReliability of the electronic circuits is one of the most prominent factor in the development of very large-scale integration (VLSI) industry. Huge demand for compact size and high performance of electronic devices leads the excessive scaling of ...
Impact of Negative Bias Temperature Instability on Gate-All-Around Flip-Flops
Negative bias temperature instability is an important reliability issue for FinFET and gate-all-around nanowire FETs at next-generation technology nodes which leads to circuit failure during the life time of the device. This paper compares the ...
Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion
As process technology continues to shrink, Process Variations and Aging effects have an increasing impact on the reliability and performance of manufactured circuits. Aging effects, namely due to Negative Bias Temperature Instability (NBTI) produce ...
Comments
Information & Contributors
Information
Published In
Publisher
IEEE Computer Society
United States
Publication History
Author Tags
Qualifiers
- Article
Contributors
Other Metrics
Bibliometrics & Citations
Bibliometrics
Article Metrics
- 0Total Citations
- 0Total Downloads
- Downloads (Last 12 months)0
- Downloads (Last 6 weeks)0
Other Metrics
Citations
View Options
View options
Get Access
Login options
Check if you have access through your login credentials or your institution to get full access on this article.
Sign in