A System for Radiation Testing and Physical Fault Injection into the FPGAs and Other Electronics

We present the first delay-fault testing approach for Field Programmable Gate Arrays (FPGAs), applicable for on-line testing as well as for off-line manufacturing and system-level testing. Our approach is based on Built-In Self-Test (BIST), it is ...

The methodology for the design and testing of fault tolerant systems implemented into an FPGA platform with different types of diagnostic techniques is presented in this paper. Basic principles of partial dynamic reconfiguration are described together ...

The objective of this paper is to propose a method to test all the delay faults located in Look-Up-Tables (LUTs) of SRAM-based symmetrical FPGAs. This method is developed in a Manufacturing-Oriented Context (MOT). In the first part of the paper, the ...