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10.1109/ETS.2005.35guideproceedingsArticle/Chapter ViewAbstractPublication PagesConference Proceedingsacm-pubtype
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Stuck-Open Fault Diagnosis with Stuck-At Model

Published: 22 May 2005 Publication History
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  • Abstract

    While most of the fault diagnosis tools are based on gate level fault models, many faults are actually at the transistor level. The stuck-open fault is one of them. In this paper we introduce a stuck-open fault diagnosis method based on the stuck-at fault model. First we investigate how stuck-open faults show in the stuck-at diagnosis. Based on the stuck-at diagnosis result, a transformation method is used to represent stuck-open faults. This method transforms the transistor level circuit description to a gate level description so that the stuck-open faults can be diagnosed directly by any of the stuck-at fault diagnosis tools. After the transformation, all the stuck-open faults are fully diagnosed by FALOC, a gate level fault diagnosis tool from Philips.

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    • (2018)Adaptive Debug and Diagnosis Without Fault DictionariesJournal of Electronic Testing: Theory and Applications10.1007/s10836-009-5109-325:4-5(259-268)Online publication date: 28-Dec-2018

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    cover image Guide Proceedings
    ETS '05: Proceedings of the 10th IEEE European Symposium on Test
    May 2005
    207 pages
    ISBN:0769523412

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    IEEE Computer Society

    United States

    Publication History

    Published: 22 May 2005

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    • (2018)Adaptive Debug and Diagnosis Without Fault DictionariesJournal of Electronic Testing: Theory and Applications10.1007/s10836-009-5109-325:4-5(259-268)Online publication date: 28-Dec-2018

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