Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design

Many system-on-chips (SOCs) today contain both digital- and analog-embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prior research in this area has focused exclusively on ...

Existing approaches for modular manufacturing test of core-based system-on-a-chip (SOC) devices do not provide any explicit mechanism for delivering two-pattern tests in the broadside mode, which is necessary to achieve reliable coverage of delay and ...

High-cost specification tests of analog/RF devices have become a bottle-neck in reducing the overall cost of high-volume manufacturing (HVM) of systems on chip (SoCs) due to lengthy testing time and expensive test equipment. Especially for fabless ...