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10.1109/IMS3TW.2008.4581617guideproceedingsArticle/Chapter ViewAbstractPublication PagesConference Proceedingsacm-pubtype
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Exploring dynamics of embedded ADC through adapted digital input stimuli

Published: 18 June 2008 Publication History

Abstract

This paper reports an evaluation of adapted digital signals as a test stimulus to test dynamic parameters of analog-to-digital converters (ADC). In the first instance, the simplest digital waveform, a pulse signal, is taken as the test stimulus. The dynamics of the device under test while applying digital signals can reflect certain faults. The method is validated by simulation of a design at the transistor level of a 6-bit flash ADC in 120nm CMOS technology.
  1. Exploring dynamics of embedded ADC through adapted digital input stimuli

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    cover image Guide Proceedings
    IMS3TW '08: Proceedings of the 2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop
    June 2008
    205 pages
    ISBN:9781424423958

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    IEEE Computer Society

    United States

    Publication History

    Published: 18 June 2008

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