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10.1109/IMS3TW.2011.20guideproceedingsArticle/Chapter ViewAbstractPublication PagesConference Proceedingsacm-pubtype
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A Concurrent Testing Technique for Analog-to-Digital Converters

Published: 16 May 2011 Publication History

Abstract

Compaction methods have been successively used for off-line testing of both digital and analog circuits as well as on-line (concurrent) testing of digital circuits. In this work, we extend the use of compaction methods for concurrent testing of analog-to-digital converters. We estimate tolerance bounds for the result of compaction and evaluate the aliasing rate.

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  • (2019)A Distributed Error and Anomaly Communication Architecture for Analog and Mixed-Signal SystemsJournal of Electronic Testing: Theory and Applications10.1007/s10836-019-05795-y35:3(317-334)Online publication date: 31-Jul-2019

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  1. A Concurrent Testing Technique for Analog-to-Digital Converters

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    cover image Guide Proceedings
    IMS3TW '11: Proceedings of the 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop
    May 2011
    160 pages
    ISBN:9780769544793

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    IEEE Computer Society

    United States

    Publication History

    Published: 16 May 2011

    Author Tags

    1. analog-to-digital converter
    2. built-in self-test
    3. concurrent test
    4. signature analysis

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    • (2019)A Distributed Error and Anomaly Communication Architecture for Analog and Mixed-Signal SystemsJournal of Electronic Testing: Theory and Applications10.1007/s10836-019-05795-y35:3(317-334)Online publication date: 31-Jul-2019

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