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Process Modeling for Photoresist Development and Design of DLR/sd (Double-Layer Resist by a Single Development) Process

Published: 01 November 2006 Publication History

Abstract

This paper describes a new simple process model for photoresist development. The model includes the consideration of chemical reactions between a photoresist and a developer, and takes the developer concentration dependence into account. The model is applied to the design of practical photo-lithography processes to determine development conditions. Through the introduction of the model-based lithographic simulations, the multilayer resist process has been successfully designed and has obtained satisfactory patterns.

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  1. Process Modeling for Photoresist Development and Design of DLR/sd (Double-Layer Resist by a Single Development) Process
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      cover image IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
      IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  Volume 6, Issue 3
      November 2006
      195 pages

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      IEEE Press

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      Published: 01 November 2006

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