research-article

Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values

Authors:

Michael A. Kochte,

Matthias Sauer,

Hans-Joachim Wunderlich,

Bernd BeckerAuthors Info & Claims

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume 34, Issue 12

Pages 2025 - 2038

https://doi.org/10.1109/TCAD.2015.2440315

Published: 01 December 2015 Publication History

Abstract

Unknown (X) values emerge during the design process as well as during system operation and test application. X-sources are for instance black boxes in design models, clock-domain boundaries, analog-to-digital converters, or uncontrolled or uninitialized sequential elements. To compute a test pattern for a given fault, well-defined logic values are required both for fault activation and propagation to observing outputs. In presence of X-values, conventional test generation algorithms, based on structural algorithms, Boolean satisfiability (SAT), or binary decision diagram-based reasoning may fail to generate test patterns or to prove faults untestable. This paper proposes the first efficient stuck-at and transition-delay fault test generation algorithm able to prove testability or untestability of faults in presence of X-values. It overcomes the principal pessimism of conventional algorithms when X-values are considered by mapping the test generation problem to the SAT of quantified Boolean formulas. Experiments on ISCAS benchmarks and larger industrial circuits investigate the increase in fault coverage for conventional deterministic and potential detection requirements for both randomized and clustered X-sources.

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Cited By

Scheibler KErb DBecker BFanucci LTeich J(2016)Accurate CEGAR-based ATPG in presence of unknown values for large industrial designsProceedings of the 2016 Conference on Design, Automation & Test in Europe10.5555/2971808.2972032(972-977)Online publication date: 14-Mar-2016
https://dl.acm.org/doi/10.5555/2971808.2972032

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Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values
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cover image IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Volume 34, Issue 12

Dec. 2015

162 pages

ISSN:0278-0070

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Copyright © 2015.

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IEEE Press

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Published: 01 December 2015

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Cited By

Scheibler KErb DBecker BFanucci LTeich J(2016)Accurate CEGAR-based ATPG in presence of unknown values for large industrial designsProceedings of the 2016 Conference on Design, Automation & Test in Europe10.5555/2971808.2972032(972-977)Online publication date: 14-Mar-2016
https://dl.acm.org/doi/10.5555/2971808.2972032

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