Simultaneous impulse stimulation and response sampling technique for built-in self test of linear analog integrated circuits
Article No.: 22, Pages 1 - 6
Abstract
This paper proposes a new impulse stimulation and response sampling technique for the implementation of a Built-In Self Test of linear analog integrated circuits embedded in mixed-signal systems. The testing technique is the monitoring of physical fault influences on impulse response characteristics through the use of single-point sampling method and window criterions. The implementation of BIST system realizes a controllable impulse generator, which provide two short impulses simultaneously for stimulating a Circuit-Under-Test, and sampling a transient impulse response. This proposed technique is cost-effective and relatively compact. Neither high-precision analog test stimuli with fault-free bit streams nor characterization and synchronization processes in DSP are required. Demonstrations of the BIST system for a Sallen-Key low-pass filter in a physical level using 0.18-μm CMOS technology show a low area overhead of 11.19%, and offer high catastrophic and parameter fault coverage of 98.24%.
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Index Terms
- Simultaneous impulse stimulation and response sampling technique for built-in self test of linear analog integrated circuits
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Information & Contributors
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Published In
August 2009
325 pages
ISBN:9781605587059
DOI:10.1145/1601896
- General Chair:
- Ivan Saraiva,
- Program Chairs:
- Renato Perez Ribas,
- Calvin Plett
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- SBC: Brazilian Computer Society
- SIGDA: ACM Special Interest Group on Design Automation
- SBMICRO: Brazilian Microelectronics Society
- IEEE Circuits & Systems Society
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Association for Computing Machinery
New York, NY, United States
Publication History
Published: 31 August 2009
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SBCCI '09
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- SBC
- SIGDA
- SBMICRO
SBCCI '09: 22nd Symposium on Integrated Circuits and System Design
August 31 - September 3, 2009
Natal, Brazil
Acceptance Rates
SBCCI '09 Paper Acceptance Rate 50 of 119 submissions, 42%;
Overall Acceptance Rate 133 of 347 submissions, 38%
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