research-article

PLL to the rescue: a novel EM fault countermeasure

Authors:

Wei He,

Jean-Luc DangerAuthors Info & Claims

DAC '16: Proceedings of the 53rd Annual Design Automation Conference

Article No.: 90, Pages 1 - 6

https://doi.org/10.1145/2897937.2898065

Published: 05 June 2016 Publication History

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Abstract

Electromagnetic injection (EMI) is a powerful and precise technique for fault injection in modern ICs. This intentional fault can be utilized to steal secret information hidden inside of ICs. Unlike laser fault injection, tedious package decapsulation is not needed for EMI, which reduces an attacker's cost and thus causes a serious information security threat. In this paper, a PLL-based sensor circuit is proposed to detect EMI reactively on chip. A fully automatic design flow is devised to integrate the proposed sensor together with a cryptographic processor. A high fault detection coverage and a small hardware overhead are demonstrated experimentally on an FPGA platform.

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Muttaki MRahman MKulkarni ATehranipoor MFarahmandi F(2024)FTC: A Universal Framework for Fault-Injection Attack Detection and PreventionIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2024.338453132:7(1311-1324)Online publication date: Jul-2024
https://doi.org/10.1109/TVLSI.2024.3384531
Ebrahimabadi MMehjabin SViera RGuilley SDanger JDutertre JKarimi N(2024)DELFINES: Detecting Laser Fault Injection Attacks via Digital SensorsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.332262343:3(774-787)Online publication date: Mar-2024
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Nabhan RDutertre JRigaud JDanger JSauvage L(2024)EM Fault Injection-Induced Clock Glitches: From Mechanism Analysis to Novel Sensor Design2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS)10.1109/IOLTS60994.2024.10616074(1-7)Online publication date: 3-Jul-2024
https://doi.org/10.1109/IOLTS60994.2024.10616074
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DAC '16: Proceedings of the 53rd Annual Design Automation Conference

June 2016

1048 pages

ISBN:9781450342360

DOI:10.1145/2897937

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 05 June 2016

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DAC '16: The 53rd Annual Design Automation Conference 2016

June 5 - 9, 2016

Texas, Austin

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Muttaki MRahman MKulkarni ATehranipoor MFarahmandi F(2024)FTC: A Universal Framework for Fault-Injection Attack Detection and PreventionIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2024.338453132:7(1311-1324)Online publication date: Jul-2024
https://doi.org/10.1109/TVLSI.2024.3384531
Ebrahimabadi MMehjabin SViera RGuilley SDanger JDutertre JKarimi N(2024)DELFINES: Detecting Laser Fault Injection Attacks via Digital SensorsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.332262343:3(774-787)Online publication date: Mar-2024
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Nabhan RDutertre JRigaud JDanger JSauvage L(2024)EM Fault Injection-Induced Clock Glitches: From Mechanism Analysis to Novel Sensor Design2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS)10.1109/IOLTS60994.2024.10616074(1-7)Online publication date: 3-Jul-2024
https://doi.org/10.1109/IOLTS60994.2024.10616074
Saß XMitev RSadeghi ACalandrino JTroncoso C(2023)Oops..! i glitched it again!Proceedings of the 32nd USENIX Conference on Security Symposium10.5555/3620237.3620586(6239-6256)Online publication date: 9-Aug-2023
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A Survey on Fault Attacks on Symmetric Key Cryptosystems

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A Survey on Fault Attacks on Symmetric Key Cryptosystems

On Second-Order Fault Analysis Resistance for CRT-RSA Implementations

Voltage Spikes on the Substrate to Obtain Timing Faults

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