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Scaling deeper to submicron: on-line testing to the rescue

Published: 01 January 1999 Publication History

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  • (2010)Circuit-Level Soft-Error MitigationSoft Errors in Modern Electronic Systems10.1007/978-1-4419-6993-4_8(203-252)Online publication date: 23-Aug-2010
  • (2002)An analog mixed-signal test controllerThe 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002.10.1109/MWSCAS.2002.1187237(I-384-7)Online publication date: 2002

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  1. Scaling deeper to submicron: on-line testing to the rescue

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      cover image ACM Conferences
      DATE '99: Proceedings of the conference on Design, automation and test in Europe
      January 1999
      730 pages
      ISBN:1581131216
      DOI:10.1145/307418
      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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      Published: 01 January 1999

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      • (2010)Circuit-Level Soft-Error MitigationSoft Errors in Modern Electronic Systems10.1007/978-1-4419-6993-4_8(203-252)Online publication date: 23-Aug-2010
      • (2002)An analog mixed-signal test controllerThe 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002.10.1109/MWSCAS.2002.1187237(I-384-7)Online publication date: 2002

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