Question Difficulty Consistent Knowledge Tracing
Abstract
Supplemental Material
- Download
- 4.96 MB
References
Index Terms
- Question Difficulty Consistent Knowledge Tracing
Recommendations
An Improved Deep Model for Knowledge Tracing and Question-Difficulty Discovery
PRICAI 2021: Trends in Artificial IntelligenceAbstractKnowledge Tracing (KT) aims to analyze a student’s acquisition of skills over time by examining the student’s performance on questions of those skills. In recent years, a recurrent neural network model called deep knowledge tracing (DKT) has been ...
EDKT: An Extensible Deep Knowledge Tracing Model for Multiple Learning Factors
Database Systems for Advanced ApplicationsAbstractKnowledge Tracing (KT) refers to the problem of predicting learners’ future potential performance given their past learning history in e-learning systems. In order to better trace the learners’ knowledge, KT tasks have become increasingly ...
What Does Time Tell? Tracing the Forgetting Curve Using Deep Knowledge Tracing
Artificial Intelligence in EducationAbstractRecurrent Neural Network (RNN) based Deep Knowledge Tracing (DKT) can extract a complex representation of student knowledge just using the historical time series of correct-incorrect responses given as input and can predict the student’s ...
Comments
Information & Contributors
Information
Published In
- General Chairs:
- Tat-Seng Chua,
- Chong-Wah Ngo,
- Proceedings Chair:
- Roy Ka-Wei Lee,
- Program Chairs:
- Ravi Kumar,
- Hady W. Lauw
Sponsors
Publisher
Association for Computing Machinery
New York, NY, United States
Publication History
Check for updates
Author Tags
Qualifiers
- Research-article
Data Availability
Funding Sources
- Ministry of Education (MOE) Singapore
Conference
Acceptance Rates
Contributors
Other Metrics
Bibliometrics & Citations
Bibliometrics
Article Metrics
- 0Total Citations
- 196Total Downloads
- Downloads (Last 12 months)196
- Downloads (Last 6 weeks)127
Other Metrics
Citations
View Options
Get Access
Login options
Check if you have access through your login credentials or your institution to get full access on this article.
Sign in