Image Hash Layer Triggered CNN Framework for Wafer Map Failure Pattern Retrieval and Classification
Abstract
A Evaluation Metric
B More Details of Experimental Results
B.1 More Details of Machine Learning based Hash Evaluation
B.2 More Details of Hash-CNN vs. 2D-CNN on Different Resized Images
B.3 More Details of Hash-CNN vs. 2D-CNN on Padded Image
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- Image Hash Layer Triggered CNN Framework for Wafer Map Failure Pattern Retrieval and Classification
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Association for Computing Machinery
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- Project Funded by the Priority Academic Program Development of Jiangsu Higher Education Institutions
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