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Analysis and optimization of thermal issues in high-performance VLSI

Published: 01 April 2001 Publication History

Abstract

This paper provides an overview of various thermal issues in high-performance VLSI with especial attention to their implications for performance and reliability. More specifically, it examines the impact of thermal effects on both interconnect design and electromigration reliability and discusses their impact on the allowable current density limits. Furthermore, it also discusses how thermal and reliability constrained current density limits may conflict with those obtained through purely performance based criterion. Additionally, it is shown that chip level thermal effects can have a significant impact on large-scale circuit optimization techniques, including the clock-skew minimization scheme, and can influence other physical design problem formulations. Finally, high-current interconnect design rules for ESD and I/O circuits are also examined.

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  • (2022)Design Space Exploration of Interconnect Materials for Cryogenic Operation: Electrical and Thermal AnalysesIEEE Transactions on Circuits and Systems I: Regular Papers10.1109/TCSI.2022.319563669:11(4610-4618)Online publication date: Nov-2022
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  • (2019)A Survey of Chip-level Thermal SimulatorsACM Computing Surveys10.1145/330954452:2(1-35)Online publication date: 30-Apr-2019
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  1. Analysis and optimization of thermal issues in high-performance VLSI

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      cover image ACM Conferences
      ISPD '01: Proceedings of the 2001 international symposium on Physical design
      April 2001
      245 pages
      ISBN:1581133472
      DOI:10.1145/369691
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      Published: 01 April 2001

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      • (2022)Design Space Exploration of Interconnect Materials for Cryogenic Operation: Electrical and Thermal AnalysesIEEE Transactions on Circuits and Systems I: Regular Papers10.1109/TCSI.2022.319563669:11(4610-4618)Online publication date: Nov-2022
      • (2019)Thermal-aware 3D Symmetrical Buffered Clock Tree SynthesisACM Transactions on Design Automation of Electronic Systems10.1145/331379824:3(1-22)Online publication date: 5-Apr-2019
      • (2019)A Survey of Chip-level Thermal SimulatorsACM Computing Surveys10.1145/330954452:2(1-35)Online publication date: 30-Apr-2019
      • (2019)A Complex Integrated Circuit Structure Transformation, Modeling and Simulation Method2019 IEEE 69th Electronic Components and Technology Conference (ECTC)10.1109/ECTC.2019.00309(2016-2021)Online publication date: May-2019
      • (2018)Compact SPICE Models of the Standard Layout Fragments in LSI Interconnections2018 IEEE East-West Design & Test Symposium (EWDTS)10.1109/EWDTS.2018.8524730(1-5)Online publication date: Sep-2018
      • (2016)Numerical Study of Conjugate Heat Transfer for Cooling the Circuit BoardJournal of Electronics Cooling and Thermal Control10.4236/jectc.2016.6301106:03(120-126)Online publication date: 2016
      • (2016)A full chip scale numerical simulation method for thermal management of 3D IC2016 17th International Conference on Electronic Packaging Technology (ICEPT)10.1109/ICEPT.2016.7583226(690-693)Online publication date: Aug-2016
      • (2014)Parallel Cyclostationarity-Exploiting Algorithm for Energy-Efficient Spectrum SensingIEICE Transactions on Communications10.1587/transcom.E97.B.326E97.B:2(326-333)Online publication date: 2014
      • (2013)Bus-driven floorplanning with thermal considerationIntegration, the VLSI Journal10.1016/j.vlsi.2012.11.00246:4(369-381)Online publication date: 1-Sep-2013
      • (2011)Thermal-aware bus-driven floorplanningProceedings of the 17th IEEE/ACM international symposium on Low-power electronics and design10.5555/2016802.2016852(205-210)Online publication date: 1-Aug-2011
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