Article

Hole analysis for functional coverage data

Authors:

Oded Lachish,

Eitan Marcus,

Shmuel Ur,

Avi ZivAuthors Info & Claims

DAC '02: Proceedings of the 39th annual Design Automation Conference

Pages 807 - 812

https://doi.org/10.1145/513918.514119

Published: 10 June 2002 Publication History

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Abstract

One of the main goals of coverage tools is to provide the user with informative presentation of coverage information. Specifically, information on large, cohesive sets of uncovered tasks with common properties is very useful. This paper describes methods for discovering and reporting large uncovered spaces (holes) for cross-product functional coverage models. Hole analysis is a presentation method for coverage data that is both succinct and informative. Using case studies, we show how hole analysis was used to detect large uncovered spaces and improve the quality of verification.

References

[1]

A. Aharon, D. Goodman, M. Levinger, Y~Lichtenstein, Y. Malka, C. Metzger, M. Molcho, and G. Shurek. Test program generation for functional verification of PowerPC processors in IBM. In Proceedings of the 32nd Design Automation Conference, pages 279--285, June 1995

Digital Library

Google Scholar

[2]

A.M. Ahi, G.D. Burroughs, A.B. Gore, S.W. LaMar, C.R. Linand, and A.L. Wieman. Design verification of the HP9000 series 700 PA-RISC workstations. Hewlett-Packard Journal, 14(8), August 1992

Google Scholar

[3]

B. Beizer. The Pentium bug, an industry watershed. Testing Techniques Newsletter, On-Line Edition, September 1995

Google Scholar

[4]

P. Cabena, P. Hadjinian, R. Stadler, J. Verhees, and A. Zanasi. Discovering Data Mining, from Concept to Implementation. Prentice Hall, 1997

Digital Library

Google Scholar

[5]

L. Fournier, Y. Arbetman, and M. Levinger. Functional verification methodology for microprocessors using the Genesys test-program generator. In Proceedings of the 1999 Design, Automation and Test in Europe Conference (DATE), pages 434--441, March 1999

Digital Library

Google Scholar

[6]

R. Grinwald, E. Harel, M. Orgad, S. Ur, and A. Ziv. User defined coverage - a tool supported methodology for design verification. In Proceedings of the 35th Design Automation Conference, pages 158--165, June 1998

Digital Library

Google Scholar

[7]

A. Hajjar, T. Chen, I. Munn, A. Andrews, and M. Bjorkman. High quality behavioral verification using statistical stopping criteria. In Proceedings of the 2001 Design, Automation and Test in Europe Conference (DATE), pages 411--418, March 2001

Digital Library

Google Scholar

[8]

M. Karnaugh. The map method for synthesis of combinational logic circuits. Transactions of the American Institute of Electrical Engineers, 72(9):593--599, November 1953

Google Scholar

[9]

B. Marick. The Craft of Software Testing, Subsystem testing Including Object Based and Object-Oriented Testing. Prentice-Hall, 1985

Digital Library

Google Scholar

[10]

C. May, E. Silha, R. Simpson, and H. Warren, editors. The PowerPC Architecture. Morgan Kaufmann, 1994

Google Scholar

[11]

J. R. Quinlan. Inductions of decision trees. Machine Learning, 1:81--106, 1986

Digital Library

Google Scholar

[12]

S. Ur and A. Ziv. Off-the-shelf vs. custom made coverage models, which is the one for you? In proceedings of STAR98: the 7th international conference on software testing analysis and review, May 1998

Google Scholar

[13]

Focus. http://www.alphaworks.ibm.com

Google Scholar

Cited By

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Gal RIbraheem WNevo ZSaleh BZiv A(2022)Data Analytics and Machine Learning for Coverage ClosureFrontiers of Quality Electronic Design (QED)10.1007/978-3-031-16344-9_5(175-225)Online publication date: 6-Sep-2022
https://doi.org/10.1007/978-3-031-16344-9_5
Gal RZiv A(2022)Machine Learning in the Service of Hardware Functional VerificationMachine Learning Applications in Electronic Design Automation10.1007/978-3-031-13074-8_14(377-424)Online publication date: 10-Aug-2022
https://doi.org/10.1007/978-3-031-13074-8_14
Abel AAdir ABlochwitz TGreenberg LSalman T(2013)Development and Verification of Complex Hybrid Systems Using Synthesizable MonitorsHardware and Software: Verification and Testing10.1007/978-3-319-03077-7_13(182-198)Online publication date: 2013
https://doi.org/10.1007/978-3-319-03077-7_13
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Published In

DAC '02: Proceedings of the 39th annual Design Automation Conference

June 2002

956 pages

ISBN:1581134614

DOI:10.1145/513918

General Chair:
Bryan Ackland
Agere Systems, Inc., Holmdel, NJ

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 10 June 2002

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DAC02: 39th Design Automation Conference

June 10 - 14, 2002

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DAC '02 Paper Acceptance Rate 147 of 491 submissions, 30%;

Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Gal RIbraheem WNevo ZSaleh BZiv A(2022)Data Analytics and Machine Learning for Coverage ClosureFrontiers of Quality Electronic Design (QED)10.1007/978-3-031-16344-9_5(175-225)Online publication date: 6-Sep-2022
https://doi.org/10.1007/978-3-031-16344-9_5
Gal RZiv A(2022)Machine Learning in the Service of Hardware Functional VerificationMachine Learning Applications in Electronic Design Automation10.1007/978-3-031-13074-8_14(377-424)Online publication date: 10-Aug-2022
https://doi.org/10.1007/978-3-031-13074-8_14
Abel AAdir ABlochwitz TGreenberg LSalman T(2013)Development and Verification of Complex Hybrid Systems Using Synthesizable MonitorsHardware and Software: Verification and Testing10.1007/978-3-319-03077-7_13(182-198)Online publication date: 2013
https://doi.org/10.1007/978-3-319-03077-7_13
Adler YUr SBlue D(2011)Evaluating Workloads Using Multi-comparative Functional CoverageHardware and Software: Verification and Testing10.1007/978-3-642-19237-1_9(57-70)Online publication date: 2011
https://doi.org/10.1007/978-3-642-19237-1_9
Guzey OWang LLevitt JFoster H(2010)Increasing the efficiency of simulation-based functional verification through unsupervised support vector analysisIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2009.203434729:1(138-148)Online publication date: 1-Jan-2010
https://dl.acm.org/doi/10.1109/TCAD.2009.2034347
Xie TMueller WLetombe F(2010)Efficient Mutation-Analysis Coverage for Constrained Random VerificationDistributed, Parallel and Biologically Inspired Systems10.1007/978-3-642-15234-4_12(114-124)Online publication date: 2010
https://doi.org/10.1007/978-3-642-15234-4_12
Adler YUr SBlue D(2009)Evaluating workloads using multi-comparative functional coverageProceedings of the 5th international Haifa verification conference on Hardware and software: verification and testing10.5555/1965974.1965985(57-70)Online publication date: 19-Oct-2009
https://dl.acm.org/doi/10.5555/1965974.1965985
Guzey OWang LLevitt JFoster HFix L(2008)Functional test selection based on unsupervised support vector analysisProceedings of the 45th annual Design Automation Conference10.1145/1391469.1391536(262-267)Online publication date: 8-Jun-2008
https://dl.acm.org/doi/10.1145/1391469.1391536
Jerinić VLanger JHeinkel UMüller DGielen G(2006)New methods and coverage metrics for functional verificationProceedings of the conference on Design, automation and test in Europe: Proceedings10.5555/1131481.1131764(1025-1030)Online publication date: 6-Mar-2006
https://dl.acm.org/doi/10.5555/1131481.1131764
Gluska ASentovich E(2006)Practical methods in coverage-oriented verification of the merom microprocessorProceedings of the 43rd annual Design Automation Conference10.1145/1146909.1146996(332-337)Online publication date: 24-Jul-2006
https://dl.acm.org/doi/10.1145/1146909.1146996
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Defining coverage views to improve functional coverage analysis

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SystemVerilog Assertions and Functional Coverage: Guide to Language, Methodology and Applications

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Defining coverage views to improve functional coverage analysis

Advanced Analysis Techniques for Cross-Product Coverage

SystemVerilog Assertions and Functional Coverage: Guide to Language, Methodology and Applications

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