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A data acquisition and information handling system in Ada for electron spectroscopy

Authors:

M. Carlsson,

L. AsplundAuthors Info & Claims

ACM SIGAda Ada Letters, Volume IX, Issue 5

Pages 89 - 100

https://doi.org/10.1145/71340.71345

Published: 01 July 1989 Publication History

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Abstract

A distributed, real time, data acquisition computer system for electron spectroscopy, ESCA, is presented. The design and implementation in Ada involves windowing, menus, forms, graphical presentation, multitasking and instrumental communication. Our experience using Ada is discussed. Ada has been used in all phases. Data types and packages are presented. It is found that the language is very suitable for scientific purposes.

References

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[2] E. Basilier, Uppsala University Institute of Physics Report, UUIP-1022, 1980.

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[3] J. Nordgren, R. Nyholm and L. Pettersson, Ann. Reg. Sci Acta Upsaliensis, 23, 96, 1980.

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[4] Hans Veenhuizen, Uppsala University Institute of Physics Report UUIP-1100, 1984.

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[5] L. Asplund, Uppsala University Institute of Physics Report, UUIP-1073, 1983.

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[6] K. Siegbahn, C. Nordling, A. Fahlman, R. Nordberg, K. Hamrin, J. Hedman, G. Johansson, T. Bergmark, S.E. Karlsson, I. Lindgren and B. Lindgren, ESCA Atomic, molecular, solid state structures studied by means of electron spectroscopy, Almqvist & Wiksell, 1967.

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[9] U. Gelius, L. Asplund, E. Basilier, S. Hedman, K. Helenelund and K. Siegbahn Nucl. Instr. and Meth. 85-117 1984.

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[10] E. Basilier, Uppsala University Institute of Physics Report, UUIP-1021, 1980.

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[11] L. Asplund, K. Helenelund, M. Carlsson and A. Gisslén, Uppsala University Institute of Physics Report UUIP-1137, 1987.

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A data acquisition and information handling system in Ada for electron spectroscopy

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Published In

ACM SIGAda Ada Letters Volume IX, Issue 5

July/Aug. 1989

75 pages

ISSN:1094-3641

DOI:10.1145/71340

Editor:
Cammie Donaldson

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Publisher

Association for Computing Machinery

New York, NY, United States

Publication History

Published: 01 July 1989

Published in SIGADA Volume IX, Issue 5

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Sputter profiling through Ni/Fe interfaces by Auger electron spectroscopy

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