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Comprehensive frequency-dependent substrate noise analysis using boundary element methods

Published: 10 November 2002 Publication History

Abstract

We present a comprehensive methodology for the electrodynamic modeling of substrate noise coupling. A new and efficient method is introduced for the calculation of the Green's function that can accommodate arbitrary substrate doping profiles and thus facilitate substrate noise analysis using boundary element methods. In addition to a discussion of the application of the method and its validation in the context of substrate transfer resistance extraction, preliminary results from its application to frequency-dependent substrate noise modeling are presented also.

References

[1]
N. Verghese, T. Schmerbeck and D. Allstot, Simulation Techniques and Solutions for Mixed-Signal Coupling in Integrated Circuits, Kluwer, 1995.
[2]
T. Li, C-H Tsai, E. Rosenbaum, S-M Kang, "Substrate Resistance Modeling and Circuit-Level Simulation of Parasitic Device Coupling Effects for CMOS I/O Circuits under ESD Stress," Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998.
[3]
M. Pfost, H.-M. Rein and T. Holzwarth, "Modeling substrate effects in the design of high-speed Si-bipolar IC's," IEEE J. Solid-State Circuits, vol. 31, no. 10, pp. 1493--1501, 1996.
[4]
J. Kanapka and J. White, "Highly accurate fast methods for extraction and sparsification of substrate coupling based on low-rank approximation," Proc. ICCAD 2001, San Jose, CA, Nov. 2001.
[5]
J. R. Phillips and L. M. Silveira, "Simulation approaches for strongly coupled interconnect systems," Proc. ICCAD 2001, San Jose, CA, Nov. 2001.
[6]
T. Smedes, N. P. van der Meijs, and A. J. van Genderen, "Boundary element methods for 3D capacitance and substrate resistance calculations in inhomogeneous media in a VLSI layout verification package," Advances in Engineering Software, vol. 20, no. 1, pp. 19--27, 1994.
[7]
I. L. Wemple and A. T. Yang, "Integrated circuit substrate coupling models based on Voronoi tessellation," IEEE Trans. Computer-Aided Design, vol. 14, no. 12, pp. 1459--1469, Dec. 1995.
[8]
K. Nabors, S. Kim and J. White, "Fast capacitance extraction of general three-dimensional structures," IEEE Trans. Microwave Theory Tech., vol. 40, no. 7, pp. 1496--1507, July 1992.
[9]
J. R. Phillips and J. K. White, "A precorrected-FFT method for electrostatic analysis of complicated 3D structures," IEEE Trans. On Computer-Aided Design, pp. 1059--1072, 1997.
[10]
J. Phillips, J. Kanapka, and J. White, "Fast methods for extraction and sparsification of substrate coupling," Proc. 37th Design Automation Conference, pp. 738--743, 2000.
[11]
J. Zhao, S. Kapur, D. E. Long, and W. W.-M. Dai, "Efficient three-dimensional extraction based on static and full-wave layered Green's functions," Proc. 35th Design Automation Conference, Jun. 1998.
[12]
A.Cangellaris, "A new methodology for the direct generation of closed-form electrostatic Green's functions in layered dielectrics," Proc. Of The Applied Computational Electromagnetics Society (ACES) Symposium, Monterey, CA, March 2000.
[13]
A. C. Cangellaris and V. I. Okhmatovski, "New closed-form Green's function in shielded planar layered media," IEEE Trans. Microwave Theory Tech., vol. 48, pp. 2225--2232, Dec. 2000.
[14]
V. I. Okhmatovski and A. C. Cangellaris, "A new technique for the derivation of closed-form Green's functions for unbounded planar layered media," IEEE Trans. Antennas & Propagation, May 2002, (in press).
[15]
L. Ladage and R. Leupers, "Resistance extraction using a routing algorithm," 30th Design Automation Conference, 1993, pp. 38--42.
[16]
Q. Li, "Layout extraction including substrate parasitics for ESD protection circuits and design rule checking," Ph.D. dissertation, University of Illinois at Urbana-Champaign, Champaign, 2001.
[17]
A. M. Niknejad, et al, "Numerically stable Green function for modeling and analysis of substrate coupling in integrated circuits," IEEE Trans. Computer-Aided Design, vol 17, no. 4, pp. 305--315, April 1998.
[18]
J. Katzenstein, et al, "iSREX Version 1.0 user's manual," Coordinated Science Lab, University of Illinois, Urbana, IL, 1999.
[19]
E. Charbon, et al, "Modeling digital substrate noise injection in mixed-signal IC's," IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, vol. 18, no. 3, 1999, pp. 301--310.
[20]
J. R. Wait, Electromagnetic Wave Theory, Harper & Row, New York, 1985.

Cited By

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  • (2005)A green function-based parasitic extraction method for inhomogeneous substrate layersProceedings of the 42nd annual Design Automation Conference10.1145/1065579.1065619(141-146)Online publication date: 13-Jun-2005
  • (2005)Soft-Spot AnalysisIEEE Design & Test10.1109/MDT.2005.9522:4(362-375)Online publication date: 1-Jul-2005
  • (2004)A scalable soft spot analysis methodology for compound noise effects in nano-meter circuitsProceedings of the 41st annual Design Automation Conference10.1145/996566.996804(894-899)Online publication date: 7-Jun-2004
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      cover image ACM Conferences
      ICCAD '02: Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
      November 2002
      793 pages
      ISBN:0780376072
      DOI:10.1145/774572
      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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      Published: 10 November 2002

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      View all
      • (2005)A green function-based parasitic extraction method for inhomogeneous substrate layersProceedings of the 42nd annual Design Automation Conference10.1145/1065579.1065619(141-146)Online publication date: 13-Jun-2005
      • (2005)Soft-Spot AnalysisIEEE Design & Test10.1109/MDT.2005.9522:4(362-375)Online publication date: 1-Jul-2005
      • (2004)A scalable soft spot analysis methodology for compound noise effects in nano-meter circuitsProceedings of the 41st annual Design Automation Conference10.1145/996566.996804(894-899)Online publication date: 7-Jun-2004
      • (2004)Methodology for expedient computation of semiconductor substrate noise couplingElectrical Performance of Electronic Packaging10.1109/EPEP.2004.1407608(273-276)Online publication date: 2004

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