article

Bug isolation via remote program sampling

Authors:

Alice X. Zheng,

Michael I. JordanAuthors Info & Claims

ACM SIGPLAN Notices, Volume 38, Issue 5

Pages 141 - 154

https://doi.org/10.1145/780822.781148

Published: 09 May 2003 Publication History

Abstract

We propose a low-overhead sampling infrastructure for gathering information from the executions experienced by a program's user community. Several example applications illustrate ways to use sampled instrumentation to isolate bugs. Assertion-dense code can be transformed to share the cost of assertions among many users. Lacking assertions, broad guesses can be made about predicates that predict program errors and a process of elimination used to whittle these down to the true bug. Finally, even for non-deterministic bugs such as memory corruption, statistical modeling based on logistic regression allows us to identify program behaviors that are strongly correlated with failure and are therefore likely places to look for the error.

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Index Terms

Bug isolation via remote program sampling

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Published In

cover image ACM SIGPLAN Notices

ACM SIGPLAN Notices Volume 38, Issue 5

May 2003

349 pages

ISSN:0362-1340

EISSN:1558-1160

DOI:10.1145/780822

Issue’s Table of Contents

PLDI '03: Proceedings of the ACM SIGPLAN 2003 conference on Programming language design and implementation
June 2003
360 pages
ISBN:1581136625
DOI:10.1145/781131
General Chair:
Ron Cytron
Washington University, USA
,
Program Chair:
Rajiv Gupta
University of Arizona, USA

Copyright © 2003 ACM.

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Association for Computing Machinery

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Publication History

Published: 09 May 2003

Published in SIGPLAN Volume 38, Issue 5

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https://dl.acm.org/doi/10.1145/3660526
Cornejo OBriola DMicucci DGinelli DMariani LSantos Parrilla AJuristo N(2024)A family of experiments about how developers perceive delayed system response timeSoftware Quality Journal10.1007/s11219-024-09660-w32:2(567-605)Online publication date: 1-Jun-2024
https://dl.acm.org/doi/10.1007/s11219-024-09660-w
Lim HDebray SVerbrugge CLhoták OShen X(2023)Automatically Localizing Dynamic Code Generation Bugs in JIT Compiler Back-EndProceedings of the 32nd ACM SIGPLAN International Conference on Compiler Construction10.1145/3578360.3580260(145-155)Online publication date: 17-Feb-2023
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