Article

A practical approach to modeling skin effect in on-chip interconnects

Authors:

Bhaskar Mukherjee,

Lei Wang,

Andrea PacelliAuthors Info & Claims

GLSVLSI '04: Proceedings of the 14th ACM Great Lakes symposium on VLSI

Pages 266 - 270

https://doi.org/10.1145/988952.989017

Published: 26 April 2004 Publication History

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Abstract

A compact modeling methodology for the skin effect in conductors with rectangular cross section is presented. Possible equivalent circuit topologies are reviewed, and their calibration on numerical simulation is discussed, highlighting the shortcomings of conventional calibration procedures. A new approach, based on the direct fitting of the impedance transfer function to numerical simulations, is shown to offer excellent accuracy for a wide range of cross-sectional wire aspect ratios. The new formulation also obviates the need for separating the wire internal and external inductances which is a prerequisite for all published models. Finally, a practical implementation of the model as an RL parallel network is presented.

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Kimuya A(2024)Modeling Signal Integrity in High-Frequency and Radio Frequency Circuits: A Comparison of Ohm's Law VariantsEmerging Technologies and Engineering Journal10.53898/etej20241211:2(1-29)Online publication date: 25-Oct-2024
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Simone SPareschi FSetti GLena D(2024)Equivalent skin effect model for time-domain analysis starting from electromagnetic simulator values2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)10.1109/EuroSimE60745.2024.10491514(1-6)Online publication date: 7-Apr-2024
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Index Terms

A practical approach to modeling skin effect in on-chip interconnects
1. Hardware
  1. Electronic design automation
    1. Physical design (EDA)

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Published In

GLSVLSI '04: Proceedings of the 14th ACM Great Lakes symposium on VLSI

April 2004

479 pages

ISBN:1581138539

DOI:10.1145/988952

General Chair:
David Garrett
Bell Labs Research, Lucent Technologies
,
Program Chairs:
John Lach
University of Virginia
,
Charles Zukowski
Columbia University

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

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Publication History

Published: 26 April 2004

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April 26 - 28, 2004

MA, Boston, USA

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Overall Acceptance Rate 312 of 1,156 submissions, 27%

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Kimuya A(2024)Modeling Signal Integrity in High-Frequency and Radio Frequency Circuits: A Comparison of Ohm's Law VariantsEmerging Technologies and Engineering Journal10.53898/etej20241211:2(1-29)Online publication date: 25-Oct-2024
https://doi.org/10.53898/etej2024121
Simone SPareschi FSetti GLena D(2024)Equivalent skin effect model for time-domain analysis starting from electromagnetic simulator values2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)10.1109/EuroSimE60745.2024.10491514(1-6)Online publication date: 7-Apr-2024
https://doi.org/10.1109/EuroSimE60745.2024.10491514
Nowak MJakubiuk KKowalak DPikoń MCzucha JStarzyński J(2021)Current divider-based nanosecond high current pulse measuring systemsMeasurement10.1016/j.measurement.2021.109600(109600)Online publication date: May-2021
https://doi.org/10.1016/j.measurement.2021.109600
Acero JSullivan C(2013)A dynamic equivalent network model of the skin effect2013 Twenty-Eighth Annual IEEE Applied Power Electronics Conference and Exposition (APEC)10.1109/APEC.2013.6520630(2392-2397)Online publication date: Mar-2013
https://doi.org/10.1109/APEC.2013.6520630
Maheshwari VMukherjee SKar RMandal DBhattacharjee A(2012)Analytical Crosstalk Modelling of On-Chip RLC Global Interconnects with Skin Effect for Ramp InputProcedia Technology10.1016/j.protcy.2012.10.0996(814-821)Online publication date: 2012
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Micallef ASpiteri Staines CApap M(2010)Modeling of an EMC test-bench for conducted emissions in solid state applicationsMelecon 2010 - 2010 15th IEEE Mediterranean Electrotechnical Conference10.1109/MELCON.2010.5476336(80-86)Online publication date: Apr-2010
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Ziegler SIu HWoodward RBorle L(2008)Theoretical and practical analysis of a current sensing principle that exploits the resistance of the copper trace2008 IEEE Power Electronics Specialists Conference10.1109/PESC.2008.4592730(4790-4796)Online publication date: Jun-2008
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Ooi BXu D(2005)Printed InductorsEncyclopedia of RF and Microwave Engineering10.1002/0471654507.eme508Online publication date: 15-Apr-2005
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Influence of skin effect on the series resistance of millimeter-wave IMPATT devices

Analysis of scalable two-π equivalent-circuit model for on-chip spiral inductors

A practical approach to model long MIS interconnects in VLSI circuits

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Influence of skin effect on the series resistance of millimeter-wave IMPATT devices

Analysis of scalable two-π equivalent-circuit model for on-chip spiral inductors

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