Cited By
View all- Dobai RGramatová E(2011)A novel automatic test pattern generator for asynchronous sequential digital circuitsMicroelectronics Journal10.1016/j.mejo.2010.10.01342:3(501-508)Online publication date: 1-Mar-2011
- Mondal AChakrabarti P(2006)Reasoning about timing behavior of digital circuits using symbolic event propagation and temporal logicIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2005.85950825:9(1793-1814)Online publication date: 1-Sep-2006
- Shanthi ASingaram L(2005)Evolution of Asynchronous Sequential CircuitsProceedings of the 2005 NASA/DoD Conference on Evolvable Hardware10.1109/EH.2005.23(93-96)Online publication date: 29-Jun-2005