research-article

Path selection for monitoring unexpected systematic timing effects

Authors:

Nicholas Callegari,

Pouria Bastani,

Sreejit Chakravarty,

Alexander TetelbaumAuthors Info & Claims

ASP-DAC '09: Proceedings of the 2009 Asia and South Pacific Design Automation Conference

Pages 781 - 786

Published: 19 January 2009 Publication History

Abstract

This paper presents a novel path selection methodology to select paths for monitoring unexpected systematic timing effects. The methodology consists of three components: path filtering, path encoding, and path clustering. Given a large set of critical paths, in path filtering, the goal is to filter out paths that cannot be functionally sensitized. To explore the space of unexpected timing effects, a set of features are defined to encode paths into path vectors. Each feature is a source of concern that may potentially contribute to the cause of an unexpected timing effect. Finally, a kernel-based clustering algorithm is employed to group similar path vectors into clusters from which the best representative paths are selected for post-silicon monitoring. The effectiveness of our proposed methodology is demonstrated through experiments on an industrial ASIC design.

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Cited By

Firouzi FYe FChakrabarty KTahoori M(2015)Aging- and Variation-Aware Delay Monitoring Using Representative Critical Path SelectionACM Transactions on Design Automation of Electronic Systems10.1145/274623720:3(1-23)Online publication date: 24-Jun-2015
https://dl.acm.org/doi/10.1145/2746237
Alpaslan EDworak JKruseman BMajhi AHeuvelman Wvan de Wiel PDe Micheli GAl-Hashimi BMueller WMacii E(2010)NIMProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871256(1373-1376)Online publication date: 8-Mar-2010
https://dl.acm.org/doi/10.5555/1870926.1871256
Xie LDavoodi ASapatnekar S(2010)Representative path selection for post-silicon timing prediction under variabilityProceedings of the 47th Design Automation Conference10.1145/1837274.1837371(386-391)Online publication date: 13-Jun-2010
https://dl.acm.org/doi/10.1145/1837274.1837371
Show More Cited By

Path selection for monitoring unexpected systematic timing effects
1. Computing methodologies
  1. Machine learning
    1. Learning paradigms
      1. Unsupervised learning

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Information & Contributors

Information

Published In

cover image ACM Conferences

ASP-DAC '09: Proceedings of the 2009 Asia and South Pacific Design Automation Conference

January 2009

902 pages

ISBN:9781424427482

General Chair:
Kazutoshi Wakabayashi
NEC Corporation

Sponsors

IEEE Circuits and Systems Society
SIGDA: ACM Special Interest Group on Design Automation
IPSJ SIGSLDM: Information Processing Society of Japan - SIG System LSI Design Methodology
IEICE ESS: Institute of Electronics, Information and Communication Engineers - Engineering Sciences Society

Publisher

IEEE Press

Publication History

Published: 19 January 2009

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Research-article

Conference

ASPDAC '09

Sponsor:

SIGDA
IPSJ SIGSLDM
IEICE ESS

ASPDAC '09: Asia and South Pacific Design Automation Conference

January 19 - 22, 2009

Yokohama, Japan

Acceptance Rates

Overall Acceptance Rate 466 of 1,454 submissions, 32%

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Cited By

Firouzi FYe FChakrabarty KTahoori M(2015)Aging- and Variation-Aware Delay Monitoring Using Representative Critical Path SelectionACM Transactions on Design Automation of Electronic Systems10.1145/274623720:3(1-23)Online publication date: 24-Jun-2015
https://dl.acm.org/doi/10.1145/2746237
Alpaslan EDworak JKruseman BMajhi AHeuvelman Wvan de Wiel PDe Micheli GAl-Hashimi BMueller WMacii E(2010)NIMProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871256(1373-1376)Online publication date: 8-Mar-2010
https://dl.acm.org/doi/10.5555/1870926.1871256
Xie LDavoodi ASapatnekar S(2010)Representative path selection for post-silicon timing prediction under variabilityProceedings of the 47th Design Automation Conference10.1145/1837274.1837371(386-391)Online publication date: 13-Jun-2010
https://dl.acm.org/doi/10.1145/1837274.1837371
Xie LDavoodi ASaluja KSapatnekar S(2010)Post-silicon diagnosis of segments of failing speedpaths due to manufacturing variationsProceedings of the 47th Design Automation Conference10.1145/1837274.1837344(274-279)Online publication date: 13-Jun-2010
https://dl.acm.org/doi/10.1145/1837274.1837344

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