pTest: an adaptive testing tool for concurrent software on embedded multicore processors
Abstract
More and more processor manufacturers have launched embedded multicore processors for consumer electronics products because such processors provide high performance and low power consumption to meet the requirements of mobile computing and multimedia applications. To effectively utilize computing power of multicore processors, software designers interest in using concurrent processing for such architecture. The master-slave model is one of the popular programming models for concurrent processing. Even if it is a simple model, the potential concurrency faults and unreliable slave systems still lead to anomalies of entire system. In this paper, we present an adaptive testing tool called pTest to stress test a slave system and to detect the synchronization anomalies of concurrent software in the master-slave systems on embedded multicore processors. We use a probabilistic finite-state automaton(PFA) to model the test patterns for stress testing and shows how a PFA can be applied to pTest in practice.
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- pTest: an adaptive testing tool for concurrent software on embedded multicore processors
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Information & Contributors
Information
Published In
April 2009
1776 pages
ISBN:9783981080155
- General Chairs:
- Luca Benini,
- Giovanni De Micheli,
- Program Chairs:
- Bashir Al-Hashimi,
- Wolfgang Mueller
Sponsors
- EDAA: European Design Automation Association
- ECSI
- EDAC: Electronic Design Automation Consortium
- SIGDA: ACM Special Interest Group on Design Automation
- The IEEE Computer Society TTTC
- The IEEE Computer Society DATC
- The Russian Academy of Sciences: The Russian Academy of Sciences
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European Design and Automation Association
Leuven, Belgium
Publication History
Published: 20 April 2009
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DATE '09
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- EDAC
- SIGDA
- The Russian Academy of Sciences
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