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Improvement and estimation of prediction accuracy of soft sensor models based on time difference

Published: 28 June 2011 Publication History

Abstract

Soft sensors are widely used to estimate process variables that are difficult to measure online. However, their predictive accuracy gradually decreases with changes in the state of the plants. We have been constructing soft sensor models based on the time difference of an objective variable y and that of explanatory variables (time difference models) for reducing the effects of deterioration with age such as the drift and gradual changes in the state of plants without reconstruction of the models. In this paper, we have attempted to improve and estimate the prediction accuracy of time difference models, and proposed to handle multiple y values predicted from multiple intervals of time difference. An exponentially-weighted average is the final predicted value and the standard deviation is the index of its prediction accuracy. This method was applied to real industrial data and its usefulness was confirmed.

References

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Cheng, C., Chiu, M.S.: A New Data-based Methodology for Nonlinear Process Modeling. Chem. Eng. Sci. 59, 2801-2810 (2004).
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Kaneko, H., Arakawa, M., Funatsu, K.: Development of a New Soft Sensor Method Using Independent Component Analysis and Partial Least Squares. AIChE J. 55, 87-98 (2009).
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Kaneko, H., Arakawa, M., Funatsu K.: Applicability Domains and Accuracy of Prediction of Soft Sensor Models. AIChE J. (2010) (in press).
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Ookita, K.: Operation and quality control for chemical plants by soft sensors. CICSJ Bull. 24, 31-33 (2006) (in Japanese).
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Kaneko, H., Arakawa, M., Funatsu, K.: Approaches to Deterioration of Predictive Accuracy for Practical Soft Sensors. In: Proceedings of PSE ASIA 2010, P054(USB) (2010).
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Kaneko, H., Funatsu K.: Maintenance-Free Soft Sensor Models with Time Difference of Process Variables. Chemom. Intell. Lab. Syst. (accepted).

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Published In

cover image ACM Conferences
IEA/AIE'11: Proceedings of the 24th international conference on Industrial engineering and other applications of applied intelligent systems conference on Modern approaches in applied intelligence - Volume Part I
June 2011
360 pages
ISBN:9783642218217
  • Editors:
  • Kishan G. Mehrotra,
  • Chilukuri K. Mohan,
  • Jae C. Oh,
  • Pramod K. Varshney,
  • Moonis Ali

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Springer-Verlag

Berlin, Heidelberg

Publication History

Published: 28 June 2011

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Author Tags

  1. applicability domain
  2. ensemble prediction
  3. prediction error
  4. soft sensor
  5. time difference

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