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Towards realization of a high-fidelity simulation model for short-term horizon forecasting in wafer fabrication facilities

Published: 05 December 2010 Publication History

Abstract

Discrete Event Simulation (DES) has widely been used for mid and long term forecasting in wafer fabrication plants. But the use of DES for short term forecasting has been limited due to the perceived modelling and computation complexity as well as the non-steady state nature of today's wafer fab operations. In this paper, we discuss some important modelling issues associated with building an online simulation model. Key elements considered are actual process routes, process and throughput modelling as a function of equipment behavior, lot size, and available processing modules, process dedication at equipment level, equipment downs at mainframe level, estimated lot release strategy, send ahead wafers, dispatch rules, and setup. Typical application areas are proactive dedication management, preventive maintenance scheduling and WIP based sampling optimization.

References

[1]
Bagchi, S., C. Chen-Ritzo, S. T. Shikalgar, and M. Toner. 2008. A full-factory simulator as a daily decision-support tool for 300mm wafer fabrication productivity. In Proceedings of the 2008 Winter Simulation Conference, ed. S. J. Mason, R. R. Hill, L. Mönch, O. Rose, T. Jefferson, and J. W. Fowler, 2777--2782. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
[2]
Noack D., R. Kohn, M. Mosinski, Z. Zhou, O. Rose, W. Scholl, P. Lendermann, and B. P. Gan. 2010. Data modelling for online simulation - requirements and architecture. In Proceedings of the 2010 FAIM Conference.
[3]
Reijers, H. A., and W. M. P. v. d. Aalst. 1999. Short-term simulation: bridging the gap between operational control and strategic decision making. Proceedings of the IASTED International Conference on Modelling and Simulation.
[4]
Scholl W., 2008. Coping with typical unpredictable incidents in a logic fab. In Proceedings of the 2008 Winter Simulation Conference, ed. S. J. Mason, R. R. Hill, L. Mönch, O. Rose, T. Jefferson, and J. W. Fowler, 2030--2034. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.

Cited By

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  • (2021)Input data modelingProceedings of the Winter Simulation Conference10.5555/3522802.3522845(1-12)Online publication date: 13-Dec-2021
  • (2018)Real-time simulation in manufacturing systemsProceedings of the 2018 Winter Simulation Conference10.5555/3320516.3320909(3319-3330)Online publication date: 9-Dec-2018
  • (2017)An easy approach to extending a short term simulation model for long term forecast in semiconductor industryProceedings of the 2017 Winter Simulation Conference10.5555/3242181.3242497(1-10)Online publication date: 3-Dec-2017
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  1. Towards realization of a high-fidelity simulation model for short-term horizon forecasting in wafer fabrication facilities

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        cover image ACM Conferences
        WSC '10: Proceedings of the Winter Simulation Conference
        December 2010
        3519 pages
        ISBN:9781424498642

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        Winter Simulation Conference

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        Published: 05 December 2010

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        WSC10
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        WSC10: Winter Simulation Conference
        December 5 - 8, 2010
        Maryland, Baltimore

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        WSC '10 Paper Acceptance Rate 184 of 281 submissions, 65%;
        Overall Acceptance Rate 3,413 of 5,075 submissions, 67%

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        View all
        • (2021)Input data modelingProceedings of the Winter Simulation Conference10.5555/3522802.3522845(1-12)Online publication date: 13-Dec-2021
        • (2018)Real-time simulation in manufacturing systemsProceedings of the 2018 Winter Simulation Conference10.5555/3320516.3320909(3319-3330)Online publication date: 9-Dec-2018
        • (2017)An easy approach to extending a short term simulation model for long term forecast in semiconductor industryProceedings of the 2017 Winter Simulation Conference10.5555/3242181.3242497(1-10)Online publication date: 3-Dec-2017
        • (2014)Automated planning and creation of simulation experiments with a domain specific ontology for semiconductor manufacturing AMHSProceedings of the 2014 Winter Simulation Conference10.5555/2693848.2694183(2628-2639)Online publication date: 7-Dec-2014
        • (2014)Enhancement of simulation-based semiconductor manufacturing forecast quality through hybrid tool down time modelingProceedings of the 2014 Winter Simulation Conference10.5555/2693848.2694156(2444-2453)Online publication date: 7-Dec-2014
        • (2013)Automatic model verification for semiconductor manufacturing simulationProceedings of the 2013 Winter Simulation Conference: Simulation: Making Decisions in a Complex World10.5555/2675983.2675876(3858-3865)Online publication date: 8-Dec-2013
        • (2013)An integrated approach to real time dispatching rules analysis at Seagate TechnologyProceedings of the 2013 Winter Simulation Conference: Simulation: Making Decisions in a Complex World10.5555/2675983.2675864(3766-3776)Online publication date: 8-Dec-2013
        • (2012)Event-based recognition and source identification of transient tailbacks in manufacturing plantsProceedings of the Winter Simulation Conference10.5555/2429759.2430125(1-12)Online publication date: 9-Dec-2012
        • (2012)A multi-stage discrete event simulation approach for scheduling of maintenance activities in a semiconductor manufacturing lineProceedings of the Winter Simulation Conference10.5555/2429759.2430029(1-10)Online publication date: 9-Dec-2012
        • (2011)Implementation of a simulation-based short-term lot arrival forecast in a mature 200mm semiconductor fabProceedings of the Winter Simulation Conference10.5555/2431518.2431747(1932-1943)Online publication date: 11-Dec-2011
        • Show More Cited By

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