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10.5555/558593.850143guideproceedingsArticle/Chapter ViewAbstractPublication PagesConference Proceedingsacm-pubtype
Article

Complex Reliability Evaluation of Voters for Fault Tolerant Designs

Published: 26 March 2001 Publication History

Abstract

Hardware Voters are bit voters computing a majority of n input bits. An m-out-of-n hardware bit voter is a circuit with n bit inputs, and 1 bit - output y, such that y=1 if at least m-out-of-n inputs bits have the value 1. A hardware voter can be constructed as two level AND-OR (equivalently OR-AND and other structures) using CMOS VLSI technology. The goal of the paper is to present Reliability Estimations, Failure Modes and Effects, Criticality Analysis (FMECA) of voting networks at the transistor level, in CMOS VLSI implementation. FMECA is performed using the functional tree of the system, representing the data flow from the lowest level functional block up to the higher level functional blocks. The main idea of this research is to identify the best designs of voting circuits in terms of reliability parameters and to identify their critical failures and effects.

References

[1]
Ahmed Barbour, Anthony S. Wojcik, "A General, Constructive Approach to Fault-Tolerant Design using Redundancy", IEEE Transactions on Computers, Vol. 38, No. 1, 1989, pag. 15-29.
[2]
P. Behrooz, "Voting Networks", IEEE Transactions on Reliability, Vol. 40, and No. 3, 1991, pag. 380-442.
[3]
BQR Reliability Engineering, "CARE Basic Tutorial", version 2.2.9, Rishon-Lezion, Israel, 2000.
[4]
C. Bolchini, G. Buonanno, D. Sciuto, R. Stefanelli, "Static Redundancy Techniques for CMOS Gates", Proc. ISCAS'96-Atlanta, U.S.A., 1996, pp. 576-579.
[5]
D.K. Pradham, "Fault-Tolerant Computer System Design", Prentice Hall, 1996.
[6]
M. Radu, "Reliability Parameters of Voting Modules" ISSE 2000, International Spring Seminar on Electronics Technology, BalatonFured, Technical University of Budapest, Hungary, 2000, pag. 377-380.
[7]
Rochit Rajsuman, "Digital Hardware Testing: Transistor-Level Fault Modeling and Testing", Artech House, Boson, London, 1992.
[8]
D. Siewiorek, R. S. Swarz, "The Theory and Practice of Reliable System Design", Digital Equipment Corporation, 1982.
[9]
Pradham D.K., "Fault-Tolerant Computer System Design", Prentice Hall, 1996.

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      cover image Guide Proceedings
      ISQED '01: Proceedings of the 2nd International Symposium on Quality Electronic Design
      March 2001
      ISBN:0769510256

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      IEEE Computer Society

      United States

      Publication History

      Published: 26 March 2001

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