An analysis of power reduction techniques in scan testing

Power consumption during at-speed scan-based testing can be significantly higher than that during normal functional mode in both shift and capture phases, which can cause circuits' reliability concerns during manufacturing test. This paper proposes a ...

Since the 1970s, researchers have widely used mutation as a testing technique, applying mainly it to validate test suites, as well as to validate test case strategies and test data generation. Mutation today is sufficiently mature for industrial ...

The input signal activities during test can be much higher than during test. Hence, it is important to reduce power consumption to avoid any failures during test. In this paper, we propose techniques to reduce power dissipations in both the ...