Article

Two-dimensional test data compression for scan-based deterministic BIST

Authors:

Hua-Guo Liang,

Sybille Hellebrand,

Hans-Joachim WunderlichAuthors Info & Claims

Proceedings of the IEEE International Test Conference 2001

Pages 894 - 902

Published: 30 October 2001 Publication History

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Moghaddam EMukherjee NRajski JSolecki JTyszer JZawada J(2019)Logic BIST With Capture-Per-Clock Hybrid Test PointsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2018.283444138:6(1028-1041)Online publication date: 1-Jun-2019
https://dl.acm.org/doi/10.1109/TCAD.2018.2834441
Mrugalski GRajski JRybak LSolecki JTyszer J(2017)Star-EDTIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2016.259721436:4(683-693)Online publication date: 1-Apr-2017
https://dl.acm.org/doi/10.1109/TCAD.2016.2597214
Lee JTouba N(2010)Correlation-based rectangular encodingIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2009.202588218:10(1483-1492)Online publication date: 1-Oct-2010
https://dl.acm.org/doi/10.1109/TVLSI.2009.2025882
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Index Terms

Two-dimensional test data compression for scan-based deterministic BIST
1. Information systems
  1. Data management systems
    1. Data structures
      1. Data layout
        Data compression

Index terms have been assigned to the content through auto-classification.

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Proceedings of the IEEE International Test Conference 2001

October 2001

1170 pages

ISBN:0780371690

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IEEE Computer Society

United States

Publication History

Published: 30 October 2001

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Moghaddam EMukherjee NRajski JSolecki JTyszer JZawada J(2019)Logic BIST With Capture-Per-Clock Hybrid Test PointsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2018.283444138:6(1028-1041)Online publication date: 1-Jun-2019
https://dl.acm.org/doi/10.1109/TCAD.2018.2834441
Mrugalski GRajski JRybak LSolecki JTyszer J(2017)Star-EDTIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2016.259721436:4(683-693)Online publication date: 1-Apr-2017
https://dl.acm.org/doi/10.1109/TCAD.2016.2597214
Lee JTouba N(2010)Correlation-based rectangular encodingIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2009.202588218:10(1483-1492)Online publication date: 1-Oct-2010
https://dl.acm.org/doi/10.1109/TVLSI.2009.2025882
Zhou BYe YLi ZZhang JWu XKe R(2010)A test set embedding approach based on twisted-ring counter with few seedsIntegration, the VLSI Journal10.1016/j.vlsi.2009.06.00143:1(81-100)Online publication date: 1-Jan-2010
https://dl.acm.org/doi/10.1016/j.vlsi.2009.06.001
Tenentes VKavousianos XKalligeros ESciuto D(2008)State skip LFSRsProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403488(474-479)Online publication date: 10-Mar-2008
https://dl.acm.org/doi/10.1145/1403375.1403488
Chun SKim YIm JKang S(2006)MICROIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2006.87822714:6(649-654)Online publication date: 1-Jun-2006
https://dl.acm.org/doi/10.1109/TVLSI.2006.878227
Chao MWang SChakradhar SCheng K(2005)Response shaperProceedings of the 2005 IEEE/ACM International conference on Computer-aided design10.5555/1129601.1129615(80-87)Online publication date: 31-May-2005
https://dl.acm.org/doi/10.5555/1129601.1129615
Li LChakrabarty K(2005)Hybrid BIST Based on Repeating Sequences and Cluster AnalysisProceedings of the conference on Design, Automation and Test in Europe - Volume 210.1109/DATE.2005.177(1142-1147)Online publication date: 7-Mar-2005
https://dl.acm.org/doi/10.1109/DATE.2005.177
Krishna CTouba N(2004)3-Stage Variable Length Continuous-Flow Scan Vector Decompression SchemeProceedings of the 22nd IEEE VLSI Test Symposium10.5555/987684.987956Online publication date: 25-Apr-2004
https://dl.acm.org/doi/10.5555/987684.987956
Metra CMak TOmaña MVassiliadis SGaudiot JPiuri V(2004)Fault secureness need for next generation high performance microprocessor design for testability structuresProceedings of the 1st conference on Computing frontiers10.1145/977091.977153(444-450)Online publication date: 14-Apr-2004
https://dl.acm.org/doi/10.1145/977091.977153
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Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate

Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST

Test Set Compression Through Alternation Between Deterministic and Pseudorandom Test Patterns

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