OPMISR: the foundation for compressed ATPG vectors

Rapid increases in the wire-able gate counts of ASICsstresses existing manufacturing test equipment in termsof test data volume and test capacity. Techniques arepresented in this paper that allow for substantialcompression of Automatic Test Pattern ...

Rapidly increasing ASIC gate counts are stressing the test capacity of manufacturing test equipment. New on-product multiple-input signature register (OPMISR) techniques compress test vectors produced by ATPG, substantially reducing data volume and test ...

Twin support vector machine is a machine learning algorithm developing from standard support vector machine. The performance of twin support vector machine is always better than support vector machine on datasets that have cross regions. Recently ...