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View all- Deb NBlanton R(2004)Multi-Modal Built-In Self-Test for Symmetric MicrosystemsProceedings of the 22nd IEEE VLSI Test Symposium10.5555/987684.987931Online publication date: 25-Apr-2004
T7: MEMS: Technology, Design, CAD and Applications
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R. Lal, P. R. Apte, K. N. Bhat, G. Bose, S. Chandra, D. K. SharmaAuthors Info & Claims
R. Lal, P. R. Apte, K. N. Bhat, G. Bose, S. Chandra, D. K. SharmaAuthors Info & ClaimsAbstract
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- T7: MEMS: Technology, Design, CAD and Applications
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January 2002
753 pages
ISBN:0769514413
Copyright © Copyright © 2002 IEEE. All Rights Reserved.
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IEEE Computer Society
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Published: 07 January 2002
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View all- Deb NBlanton R(2004)Multi-Modal Built-In Self-Test for Symmetric MicrosystemsProceedings of the 22nd IEEE VLSI Test Symposium10.5555/987684.987931Online publication date: 25-Apr-2004
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