Article

Comparing Functional and Structural Tests

Authors:

Ismed Hartanto,

Lee BentzAuthors Info & Claims

ITC '00: Proceedings of the 2000 IEEE International Test Conference

Page 400

Published: 03 October 2000 Publication History

Abstract

This paper describes an experimental study tounderstand issues and requirements forstructural-based testing using low cost testers,compared to functional-based testing using expensivetesters. Several studies have been directed at theeffectiveness of various test methods, but noneexplicitly addressed issues involved in attempting toreplace functional vectors with scan vectors and nonecarried the experiment further by placing defectivechips into systems and running system tests. This paperdescribes the results of such an experiment and offersinsight into necessary requirements for reduction orelimination of functional tests.

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Cited By

Aghaei BKhademzadeh AReshadi MBadie K(2017)Link TestingJournal of Electronic Testing: Theory and Applications10.1007/s10836-017-5646-033:2(209-225)Online publication date: 1-Apr-2017
https://dl.acm.org/doi/10.1007/s10836-017-5646-0
Abelein UCook AEngelke PGlaß MReimann FGómez LRuss TTeich JUll DWunderlich HFettweis GNebel W(2014)Non-intrusive integration of advanced diagnosis features in automotive E/E-architecturesProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2617114(1-6)Online publication date: 24-Mar-2014
https://dl.acm.org/doi/10.5555/2616606.2617114
Fang HWang ZGu XChakrabarty K(2011)Deterministic test for the reproduction and detection of board-level functional failuresProceedings of the 16th Asia and South Pacific Design Automation Conference10.5555/1950815.1950916(491-496)Online publication date: 25-Jan-2011
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Information

Published In

cover image Guide Proceedings

ITC '00: Proceedings of the 2000 IEEE International Test Conference

October 2000

ISBN:0780365461

Copyright © Copyright (c) 2000 Institute of Electrical and Electronics Engineers, Inc. All rights reserved.

Publisher

IEEE Computer Society

United States

Publication History

Published: 03 October 2000

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Cited By

Aghaei BKhademzadeh AReshadi MBadie K(2017)Link TestingJournal of Electronic Testing: Theory and Applications10.1007/s10836-017-5646-033:2(209-225)Online publication date: 1-Apr-2017
https://dl.acm.org/doi/10.1007/s10836-017-5646-0
Abelein UCook AEngelke PGlaß MReimann FGómez LRuss TTeich JUll DWunderlich HFettweis GNebel W(2014)Non-intrusive integration of advanced diagnosis features in automotive E/E-architecturesProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2617114(1-6)Online publication date: 24-Mar-2014
https://dl.acm.org/doi/10.5555/2616606.2617114
Fang HWang ZGu XChakrabarty K(2011)Deterministic test for the reproduction and detection of board-level functional failuresProceedings of the 16th Asia and South Pacific Design Automation Conference10.5555/1950815.1950916(491-496)Online publication date: 25-Jan-2011
https://dl.acm.org/doi/10.5555/1950815.1950916
Liu XZhang YYuan FXu QDe Micheli GAl-Hashimi BMueller WMacii E(2010)Layout-aware pseudo-functional testing for critical paths considering power supply noise effectsProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871271(1432-1437)Online publication date: 8-Mar-2010
https://dl.acm.org/doi/10.5555/1870926.1871271
Datta RSebastine ARaghunathan ACarpenter GNowka KAbraham J(2010)On-Chip Delay Measurement Based Response Analysis for Timing CharacterizationJournal of Electronic Testing: Theory and Applications10.1007/s10836-010-5188-126:6(599-619)Online publication date: 1-Dec-2010
https://dl.acm.org/doi/10.1007/s10836-010-5188-1
Fang HChakrabarty KFujiwara H(2010)RTL DFT Techniques to Enhance Defect Coverage for Functional Test SequencesJournal of Electronic Testing: Theory and Applications10.1007/s10836-009-5135-126:2(151-164)Online publication date: 1-Apr-2010
https://dl.acm.org/doi/10.1007/s10836-009-5135-1
Yuan FXu Q(2009)On systematic illegal state identification for pseudo-functional testingProceedings of the 46th Annual Design Automation Conference10.1145/1629911.1630095(702-707)Online publication date: 26-Jul-2009
https://dl.acm.org/doi/10.1145/1629911.1630095
Maxwell P(2003)Wafer-Package Test Mix for Optimal Defect Detection and Test Time SavingsIEEE Design & Test10.1109/MDT.2003.123226020:5(84-89)Online publication date: 1-Sep-2003
https://dl.acm.org/doi/10.1109/MDT.2003.1232260
Cory BKapur RUnderwood B(2003)Speed Binning with Path Delay Test in 150-nm TechnologyIEEE Design & Test10.1109/MDT.2003.123225520:5(41-45)Online publication date: 1-Sep-2003
https://dl.acm.org/doi/10.1109/MDT.2003.1232255
Santos MGonçalves FTeixeira ITeixeira J(2002)RTL Design Validation, DFT and Test Pattern Generation for High Defects CoverageJournal of Electronic Testing: Theory and Applications10.1023/A:101499761071418:2(179-187)Online publication date: 1-Apr-2002
https://dl.acm.org/doi/10.1023/A%3A1014997610714
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