Compact test generation for bridging faults under I/sub DDQ/ testing

Abstract: We propose a procedure to generate compact test sets for bridging faults under I/sub DDQ/ testing. Several techniques are employed to achieve compact test sets. Heuristics developed for stuck-at faults are shown to be effective in this context. The techniques especially designed for bridging faults are based on the observation that the yet-undetected faults can be represented using sets of lines and that a minimum test set size is obtained if the line sets representing yet-undetected faults are halved with every additional test vector. Logic blocks called bit-adders allow the partitioning of the line sets using a test generator for stuck-at faults, without having to determine in advance how the lines in a given set will be divided. Thus partitioning can be performed in a cost effective way for any line set size. Experimental results show that the test sets generated by the proposed procedure are smaller than those obtained by previously proposed procedures.