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View all- Pomeranz I(2018)Partially Invariant Patterns for LFSR-Based Generation of Close-to-Functional Broadside TestsACM Transactions on Design Automation of Electronic Systems10.1145/320140523:4(1-18)Online publication date: 29-May-2018
- Pomeranz I(2016)Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside TestsACM Transactions on Design Automation of Electronic Systems10.1145/291198322:1(1-22)Online publication date: 27-May-2016