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Test Compression and Hardware Decompression for Scan-Based SoCs

Published: 16 February 2004 Publication History

Abstract

We present a new decompression architecture suitable for embedded cores in SoCs which focuses on improving the download time by avoiding higher internal-to-ATE clock ratios and by exploiting hardware parallelism. The Bounded Huffman compression facilitates decompression hardware tradeoffs. Our technique is scalable in that the downloadable RAM-based decode table and accommodates for different SoC cores with different characteristics such as the number of scan chains and test set data distributions.

References

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{1} D. S. Hirschberg and D. A. Lelewer. Efficient decoding of prefix codes. Commun. ACM, 33(4):449-459, 1990.
[2]
{2} H. Ichihara, A. Ogawa, T. Inoue, and A. Tamura. Dynamic test compression using statisical coding. In Proc. of Asian Test Symposium, pages 143-148, 2001.
[3]
{3} A. Jas, J. Ghosh-Dastidar, Ng, and N. A. Touba. An efficient test vector compression scheme using selective huffman coding. In IEEE Trans. on CAD, number 6, pages 797-806, June 2003.
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{4} B.-J. Shie and C.-Y. Lee. An efficient vlc decompression scheme for user-defined coding tables. Vol. 4, pp. 1961- 1964, ICASSP '99.
[5]
{5} A. Turpin and A. Moffat. Practical length-limited coding for large alphabets. The Computer Journal, 38(5):339- 347, 1995.

Cited By

View all
  • (2018)Partially Invariant Patterns for LFSR-Based Generation of Close-to-Functional Broadside TestsACM Transactions on Design Automation of Electronic Systems10.1145/320140523:4(1-18)Online publication date: 29-May-2018
  • (2016)Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside TestsACM Transactions on Design Automation of Electronic Systems10.1145/291198322:1(1-22)Online publication date: 27-May-2016

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  1. Test Compression and Hardware Decompression for Scan-Based SoCs

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        cover image ACM Conferences
        DATE '04: Proceedings of the conference on Design, automation and test in Europe - Volume 1
        February 2004
        688 pages
        ISBN:0769520855

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        IEEE Computer Society

        United States

        Publication History

        Published: 16 February 2004

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        Overall Acceptance Rate 518 of 1,794 submissions, 29%

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        • (2018)Partially Invariant Patterns for LFSR-Based Generation of Close-to-Functional Broadside TestsACM Transactions on Design Automation of Electronic Systems10.1145/320140523:4(1-18)Online publication date: 29-May-2018
        • (2016)Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside TestsACM Transactions on Design Automation of Electronic Systems10.1145/291198322:1(1-22)Online publication date: 27-May-2016

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