research-article

A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm

Authors:

Jian-Hui Jiang,

Hai-Gen HuAuthors Info & Claims

Volume 34, Issue 5

Pages 1136 - 1151

https://doi.org/10.1007/s11390-019-1965-1

Published: 01 September 2019 Publication History

Abstract

The reliability allowance of circuits tends to decrease with the increase of circuit integration and the application of new technology and materials, and the hardening strategy oriented toward gates is an effective technology for improving the circuit reliability of the current situations. Therefore, a parallel-structured genetic algorithm (GA), PGA, is proposed in this paper to locate reliability-critical gates to successfully perform targeted hardening. Firstly, we design a binary coding method for reliability-critical gates and build an ordered initial population consisting of dominant individuals to improve the quality of the initial population. Secondly, we construct an embedded parallel operation loop for directional crossover and directional mutation to compensate for the deficiency of the poor local search of the GA. Thirdly, for combination with a diversity protection strategy for the population, we design an elitism retention based selection method to boost the convergence speed and avoid being trapped by a local optimum. Finally, we present an ordered identification method oriented toward reliability-critical gates using a scoring mechanism to retain the potential optimal solutions in each round to improve the robustness of the proposed locating method. The simulation results on benchmark circuits show that the proposed method PGA is an efficient locating method for reliability-critical gates in terms of accuracy and convergence speed.

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Cited By

Shi ZXiao JJiang JZhang YZhou Y(2024)ARA-RCIV: Identifying Reliability-Critical Input Vectors of Logic Circuits Based on the Association Rules Analysis ApproachIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2024.337246143:8(2479-2492)Online publication date: 1-Aug-2024
https://dl.acm.org/doi/10.1109/TCAD.2024.3372461
Xiao JChen WLou JJiang JZhou Q(2022)Identifying Reliability-Critical Primary Inputs of Combinational Circuits Based on the Model of Gate-Sensitive AttributesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2022.314219441:11(4708-4720)Online publication date: 1-Nov-2022
https://dl.acm.org/doi/10.1109/TCAD.2022.3142194
Xiao JJi QShen QJiang JHuang YLou J(2022)Accelerating stochastic‐based reliability estimation for combinational circuits at RTL using GPU parallel computingInternational Journal of Intelligent Systems10.1002/int.2294037:11(8309-8326)Online publication date: 9-Jun-2022
https://dl.acm.org/doi/10.1002/int.22940

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A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm

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Published In

cover image Journal of Computer Science and Technology

Journal of Computer Science and Technology Volume 34, Issue 5

Sep 2019

228 pages

ISSN:1000-9000

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Copyright © 2019 Springer Science+Business Media, LLC, part of Springer Nature.

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Springer-Verlag

Berlin, Heidelberg

Publication History

Published: 01 September 2019

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Cited By

Shi ZXiao JJiang JZhang YZhou Y(2024)ARA-RCIV: Identifying Reliability-Critical Input Vectors of Logic Circuits Based on the Association Rules Analysis ApproachIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2024.337246143:8(2479-2492)Online publication date: 1-Aug-2024
https://dl.acm.org/doi/10.1109/TCAD.2024.3372461
Xiao JChen WLou JJiang JZhou Q(2022)Identifying Reliability-Critical Primary Inputs of Combinational Circuits Based on the Model of Gate-Sensitive AttributesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2022.314219441:11(4708-4720)Online publication date: 1-Nov-2022
https://dl.acm.org/doi/10.1109/TCAD.2022.3142194
Xiao JJi QShen QJiang JHuang YLou J(2022)Accelerating stochastic‐based reliability estimation for combinational circuits at RTL using GPU parallel computingInternational Journal of Intelligent Systems10.1002/int.2294037:11(8309-8326)Online publication date: 9-Jun-2022
https://dl.acm.org/doi/10.1002/int.22940
Sun ZJi QWu ZLiu A(2020)A Location Method for Reliability-Critical Paths Based on Monte Carlo Search TreeMachine Learning for Cyber Security10.1007/978-3-030-62463-7_10(100-114)Online publication date: 8-Oct-2020
https://dl.acm.org/doi/10.1007/978-3-030-62463-7_10

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