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Strongly Code Disjoint Checkers

Published: 01 June 1988 Publication History

Abstract

Strongly code-disjoint (SCD) checkers are defined and shown to include totally self-checking (TSC) code-disjoint checkers. This type of checker is the natural companion of strongly fault-secure (SFS) networks. SCD checkers are the largest class of checkers with which a combinational system may achieve the TSC goal. Some examples are given to illustrate the design of SCD checkers.

References

[1]
{1} D. A. Anderson, "Design of self-checking digital networks using coding techniques," Rep. 527, CSL/Univ. Illinois, Sept. 1971.
[2]
{2} J. M. Ashjaee and S. M. Reddy, "On totally self-checking checkers for separable codes," in Proc. 6th FTCS, Pittsburgh, PA, June 21-23, 1976.
[3]
{3} W. C. Carter and P. R. Schneider, "Design of dynamically checked computers," in Proc. IFIP Congress, Edinburgh, 1968, Inf. Processing 68, Amsterdam, North Holland, 1969.
[4]
{4} B. Courtois, "Failure mechanisms, fault hypotheses and analytical testing on LSI NMOS (HMOS) circuits," in Proc. VLSI 81, Univ. Edinburgh, 1981.
[5]
{5} J. Galiay, Y. Crouzet, M. Vergniault, "Physical versus logical fault models MOS LSI circuits: Impact on their testability," IEEE Trans. Comput., June 1980.
[6]
{6} I. Jansch and B. Courtois, "Design of checkers based on analytical fault hypotheses," in Proc. 20th Euro. Solid-State Circuits Conf., Edinburgh, Scotland, Sept. 1984.
[7]
{7} J. P. Khakbaz and E. J. McCluskey, "Self testing embedded parity checkers exaustive XOR gate testing," Stanford Univ., CRC Rep. 82- 10/CSL TN 207, June 1982.
[8]
{8} J. P. Mak, J. A. Abraham, and E. S. Davidson, "The design of PLAs with concurrent error detection," in Proc. 12th FTCS, Santa Monica, CA, June 22-24, 1982.
[9]
{9} McCluskey and F. W. Clegg, "Fault equivalence in combinational logic networks," IEEE Trans. Comput., vol. C-20, pp. 1286-1293, Nov. 1971.
[10]
{10} M. Nicolaidis, I. Jansch, and B. Courtois, "Strongly code disjoint checkers," in Proc. 14th FTCS, Orlando, FL, June 1984.
[11]
{11} M. Nicolaidis, "An unified BIST approach using specific strongly code disjoint checkers design," IMAG Rep. 599, Mar. 1986.
[12]
{12} J. E. Smith and G. Metze, "Strongly fault secure logic networks," IEEE Trans. Comput., June 1978.
[13]
{13} J. Viaud and R. David, "Sequentially self-checking circuits," in Proc. FTCS 10, June 1980, pp. 263-268.
[14]
{14} J. P. Wakerly, "Partially self-checking circuits and their use in performing logical operations," IEEE Trans. Comput., July 1974.

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  • (2005)Low Cost and High Speed Embedded Two-Rail Code CheckerIEEE Transactions on Computers10.1109/TC.2005.3054:2(153-164)Online publication date: 1-Feb-2005
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Published In

cover image IEEE Transactions on Computers
IEEE Transactions on Computers  Volume 37, Issue 6
June 1988
136 pages

Publisher

IEEE Computer Society

United States

Publication History

Published: 01 June 1988

Author Tags

  1. combinational system
  2. combinatorial circuits
  3. error detection codes.
  4. strongly code disjoint checkers
  5. strongly fault secure networks
  6. totally self-checking

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  • (2005)Low Cost and High Speed Embedded Two-Rail Code CheckerIEEE Transactions on Computers10.1109/TC.2005.3054:2(153-164)Online publication date: 1-Feb-2005
  • (2003)High Speed and Highly Testable Parallel Two-Rail Code CheckerProceedings of the conference on Design, Automation and Test in Europe - Volume 110.5555/789083.1022793Online publication date: 3-Mar-2003
  • (2003)Fault-tolerant platforms for automotive safety-critical applicationsProceedings of the 2003 international conference on Compilers, architecture and synthesis for embedded systems10.1145/951710.951734(170-177)Online publication date: 30-Oct-2003
  • (2002)On-Chip Clock Faults' DetectorJournal of Electronic Testing: Theory and Applications10.1023/A:101657023020518:4-5(555-564)Online publication date: 1-Aug-2002
  • (1999)Modular TSC Checkers for Bose-Lin and Bose CodesProceedings of the 1999 17TH IEEE VLSI Test Symposium10.5555/832299.836496Online publication date: 26-Apr-1999
  • (1998)On-line detection of logic errors due to crosstalk, delay, and transient faultsProceedings of the 1998 IEEE International Test Conference10.5555/648020.745605(524-533)Online publication date: 18-Oct-1998
  • (1998)Highly testable and compact 1-out-of-n code checker with single outputProceedings of the conference on Design, automation and test in Europe10.5555/368058.368565(981-982)Online publication date: 23-Feb-1998
  • (1998)Concurrent Checking of Clock Signal CorrectnessIEEE Design & Test10.1109/54.73592615:4(42-48)Online publication date: 1-Oct-1998
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