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Article
April 1996
Test point insertion based on path tracing
- N. A. Touba,
- E. J. McCluskey
VTS '96: Proceedings of the 14th IEEE VLSI Test SymposiumPage 2

This paper presents an innovative method for inserting test points in the circuit-under-test to obtain complete fault coverage for a specified set of test patterns. Rather than using probabilistic techniques for test point placement, a path tracing ...
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