Journal of Electronic Testing: Theory and Applications

Two alternative BIST schemes are proposed for structural testing of pipelined Analog-to-Digital Converters (ADC). They are oriented to fault detection in the converter stages rather than to measure the whole ADC electrical performance parameters. The ...

A new Built-In Self-Test structure, based on the information provided by the XY-operation (Lissajous curves) is introduced in this paper. A Digital Signature is obtained which is used to discriminate catastrophic as well as parametric defects. High ...

This paper develops a new formal technique to verify the frequency response of analog circuits using global optimization techniques. Since simulation-based approaches are unable to cover the design space, there is a need for formal approaches to verify ...

By their nature, mixed-signal circuits have to be tested for both structural integrity and parametric performance. For the example of data converters we review test pattern selection strategies geared towards structural and performance testing. We ...

Test cost is one of the main factors determining the profit margin of a device in production. Current test strategies require hundreds of measurements to determine the specifications of a parameter. In this paper, we present an automatic test-vector ...

Developments in electronic/fluidic microsystems are progressing rapidly. The ultimate goal is to deliver products in the 10,000 fluidic reaction-wells range. Exciting applications include massive parallel DNA analysis and automatic drug synthesis. Until ...

This paper addresses MEMS testing through a case study: a micromachined magnetic field sensor with on-chip electronics. The sensor element is based on a cantilever beam that is deflected by means of the Lorentz force. Embedded piezoresistors are used to ...