Application of Contactless Testing to PCBs with BGAs and Open Sockets
This paper introduces a practical test method that combines statistics with a contactless test approach. Experiments using real PCBs show the effectiveness of the method, where significant z-scores are obtained to discriminate defective interconnects. ...
A High Performance SEU Tolerant Latch
This paper presents and analyzes a high performance latch tolerating single event upsets (SEU) in 45 nm CMOS technology. The internal nodes of the latch are immune to SEUs by combining Muller C-elements with dual modular redundancy and interlocked ...
Automated Functional Test Generation for Digital Systems Through a Compact Binary Differential Evolution Algorithm
- Alfonso Martinez Cruz,
- Ricardo Barrón Fernández,
- Herón Molina Lozano,
- Marco Antonio Ramírez Salinas,
- Luis Alfonso Villa Vargas
At present, the functional verification of a device represents the highest cost during manufacturing. To reduce that cost, several methods have been suggested. In this work we propose a method which produces a set of binary test sequences by means of a ...
Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors
Testing the RF functions of systems-on-chip incurs a very high cost. Built-in test is a promising alternative to facilitate testing and reduce cost. However, designing built-in test circuits that tap into the sensitive RF signal paths, in order to ...
A Novel Built-in Current Sensor for N-WELL SET Detection
This paper presents and evaluates a new built-in current sensor used to detect n-well single-event transients (SETs) induced by radiation strikes in integrated circuits (IC). A 28 nm bulk CMOS test chip containing the proposed sensor design was ...
A Maximum Power Algorithm to Find Frequencies for Aperiodic Clock Testing
The total logic activity produced in a digital circuit during testing, and hence the total energy consumed, is an invariant of a set of tests. Faster we consume this energy, shorter will the test time be. Thus, to minimize the test time we may maximize ...
Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell
Integrated circuits operating in space and harsh radiation environments are subject to the progressive accumulation of Total Ionizing Dose (TID), as well as to Single Event Transients (SET) produced by single energetic particles. We designed Bulk Built-...
