Journal of Electronic Testing: Theory and Applications

Single Event Transients (SET) pose a growing challenge to reliability of memory circuits as the device dimensions continue to shrink. It is essential to assess the effect of decreasing technology lengths on the resilience and power dissipation of ...

Embedded systems and applications have recently emerged as a domain of high interest to the general public in developing countries. Unfortunately, these countries lack the technological infrastructure for the design, testing, and implementation of ...

Reconfigurable Scan Networks (RSNs) are widely used for accessing instruments offline during debug, test and validation, as well as for performing system-level-test and online system health monitoring. The correct operation of RSNs is essential, ...

Software testing is the most crucial stage in the software development process. Structural testing, functional testing and models that even support hybrid testing are different software testing techniques. Basic path testing, the most significant ...${}^{\mathrm{}}$

Multi-site measurement (testing) increases throughput and reduces production test costs by simultaneously testing multiple chips. However, as the number of test sites is increased (to maximize throughput further), site-to-site variation in analog ...

Hardware security has become most prevalent challenging concept of improving the Internet of Things (IoT) in human routine as well as in future engineering processes. IoT systems face a wide range of problems, including a dearth of resources, a ...

Hardware Trojan (HT) intrusion at different integrated circuit (IC) phases is the most important concern for the semiconductor industries. Recently, machine learning (ML) models have been used to detect HT from the pre-silicon IC phase, which ...$\mathrm{}$$\mathrm{}$$\mathrm{}$