Modification of Ge-rich GeSbTe surface during the patterning process of phase-change memories
- Yann Canvel,
- Sébastien Lagrasta,
- Christelle Boixaderas,
- Sébastien Barnola,
- Yann Mazel,
- Karen Dabertrand,
- Eugénie Martinez
An optimized Ge-rich GeSbTe (GST) ternary alloy is investigated to improve the thermal stability of future phase change memories (PCMs). The patterning process used for their manufacturing may change the GST surface chemical ...
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Highlights
- The patterning process of an optimized Ge-rich GeSbTe (GST) structure is studied.
Oxide regrowth mechanism during silicon nitride etching in vertical 3D NAND structures
It is essential to selectively etch Si3N4 in the presence of SiO2 during the process of fabricating vertical 3D NAND structures. SiO2 etching inhibitors can be added to H3PO4 to increase Si3N4-to-SiO2 etch selectivity; however, the ...
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Highlights
- Oxide regrowth occurs on Si3N4/SiO2 pair-layered stack 3D structure in selective Si3N4 etching.
Post-release deformation and curvature correction of an electrothermally actuated MEMS bilayer platform
Surface micromachined devices are known to have residual stress-induced deformation. This paper presents the effects of residual stress on the flatness of an electrothermally actuated large aperture MEMS bilayer platform. The platform ...
Impact of concentration variation and thermal annealing on performance of multilayer OSC consisting of sandwiched P3HT layer between PEDOT: PSS and P3HT:PCBM
In this paper, comprehensive study on variation in composition ratio and thermal annealing of multilayer organic solar cells (OSC) has been demonstrated. Our previous work reported that in comparison to the conventional OSC structure, ...
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Highlights
- Organic solar cell (OSC) with buffered P3HT layer added between PEDOT:PSS and P3HT:PCBM is presented.
Investigation of the Zn and Cu oxides for heterojunction thin film solar cell application
- Z. Starowicz,
- K. Gawlińska-Nęcek,
- M. Bartmański,
- M. Wlazło,
- T. Płociński,
- B. Adamczyk-Cieślak,
- G. Putynkowski,
- P. Panek
In this work the results of basic material studies of the zinc and copper oxides as components of heterojunction solar cells were shown. Basing on the optical constants the light absorption properties and range of required thicknesses ...
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Highlights
- Main principles for designing solar cells from inexpensive, earth-abundant ZnO/CuxO.
Fabrication of ultra-long tapered optical fibers
In this paper the detailed description of tapered optical fiber (TOF) fabrication process with the use of fusion splicer is given. Developed method allows TOF fabrication of a given waist region length l up to 4 mm with a micrometers ...
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Highlights
- Tapered optical fiber with up to 4 mm long waist regions.
- Possibility of TOF ...
Polydimethylsiloxane as polymeric protective coating for fabrication of ultra-thin chips
The bendable silicon-based ultra-thin chips (UTCs), with thickness below 50 μm are needed to provide high-performance flexible electronics for several emerging applications ranging from flexible displays to robotic e-skin. The UTCs ...
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Highlights
- PDMS is used for front-side protection during alkaline wet etching of silicon.
- ...
Fabrication, electrical characterization and sub-ng mass resolution of sub-μm air-gap bulk mode MEMS mass sensors for the detection of airborne particles
In this study, we propose to realize high-performance inertial Micro-Electro-Mechanical Systems (MEMS) mass sensors by the thick oxide as a mask layer fabrication technique. This method enables to reduce the air-gap to sub-μm in ...
Impact of roughness of TiN bottom electrode on the forming voltage of HfO2 based resistive memories
- C. Charpin-Nicolle,
- M. Bonvalot,
- R. Sommer,
- A. Persico,
- M.L. Cordeau,
- S. Belahcen,
- B. Eychenne,
- Ph. Blaise,
- S. Martinie,
- S. Bernasconi,
- E. Jalaguier,
- E. Nowak
In this work, we study the impact of roughness of TiN bottom electrode on the forming voltage of 1R TiN/HfO2/Ti/TiN based ReRAM devices. A novel and atypical strategy is proposed to induce a controlled roughness of the bottom electrode,...
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Highlights
- Evolution of the forming voltage of HfO2-based resistive memories as function of the roughness of TiN Bottom Electrode.