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Fast PWM-Based Test for High Resolution ΣΔ ADCs

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Abstract

This work describes a novel test strategy that uses digital stimuli for cheap, fast, though accurate, testing of high resolution ΣΔ ADCs. Simulations and measurements showed a discrimination threshold on specification parameters up to −90 dBc. The proposed method helps to reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based self-calibration.

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Authors and Affiliations

  1. Politecnico di Bari, Bari, Italy

    Daniela De Venuto

  2. Politecnico di Torino, Turin, Italy

    Leonardo Reyneri

Authors
  1. Daniela De Venuto
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  2. Leonardo Reyneri
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Corresponding authors

Correspondence to Daniela De Venuto or Leonardo Reyneri.

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Responsible Editor: M. Lubaszewski

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De Venuto, D., Reyneri, L. Fast PWM-Based Test for High Resolution ΣΔ ADCs. J Electron Test 23, 539–548 (2007). https://doi.org/10.1007/s10836-007-5047-x

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  • DOI: https://doi.org/10.1007/s10836-007-5047-x

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