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VLIW: a case study of parallelism verification

Published: 13 June 2005 Publication History

Abstract

Parallelism in processor architecture and design imposes a verification challenge as the exponential growth in the number of execution combinations becomes unwieldy. In this paper we report on the verification of a Very Large Instruction Word processor. The verification team used a sophisticated test program generator that modeled the parallel aspects as sequential constraints, and augmented the tool with manually written test templates. The system created large numbers of legal stimuli, however the quality of the tests was proved insufficient by several post silicon bugs. We analyze this experience and suggest an alternative, parallel generation technique. We show through experiments the feasibility of the new technique and its superior quality along several dimensions. We claim that the results apply to other parallel architectures and verification environments.

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Adir, A. and Shurek, G. Generating Concurrent Test-Programs with Collisions for Multi-Processor Verification. In Proceedings of the IEEE International High Level Design Validation and Test Workshop (HLDVT '02), 2002, 79--82.
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Sullivan, M., Wilson, P., Montemayor, C., Evers, R. and Yen, J. Multiprocessor Design Verification with Generated Realistic MP Programs. In Proceedings of IEEE 14'th Annual IPCCC, 1995, 389--395.
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Aharon, A., Goodman, D., Levinger, M., Lichtenstein, Y., Malka, Y., Metzger, C., Molcho, M. and Shurek, G. Test Program Generation for Functional Verification of PowerPC Processors in IBM. In Proceedings of 32nd Design Automation Conference (DAC '95), 1995, 279--285.
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Malandain, D., Palmen, P., Taylor, M., Aharoni, M., Arbetman, Y. An Effective and Flexible approach to Functional Verification of Processor Families. In Proceedings of the IEEE International High Level Design Validation and Test Workshop (HLDVT '02), 2002, 93--98
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Adir, A., Almog, E., Fournier, L., Marcus, E., Rimon, M., Vinov, M. and Ziv, A. Genesys-Pro: Innovations in Test Program Generation for Functional Processor Verification. IEEE Design & Test of Computers, Mar-Apr. 2004, 84--93.
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Cited By

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  • (2006)DVGen: Increasing Coverage by Automatically Combining Test Specifications2006 IEEE International High Level Design Validation and Test Workshop10.1109/HLDVT.2006.320011(3-10)Online publication date: Nov-2006

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    cover image ACM Conferences
    DAC '05: Proceedings of the 42nd annual Design Automation Conference
    June 2005
    984 pages
    ISBN:1595930582
    DOI:10.1145/1065579
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Publication History

    Published: 13 June 2005

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    Author Tags

    1. VLIW
    2. functional verification
    3. parallelism
    4. processor verification
    5. test generation

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    June 13 - 17, 2005
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    • (2006)DVGen: Increasing Coverage by Automatically Combining Test Specifications2006 IEEE International High Level Design Validation and Test Workshop10.1109/HLDVT.2006.320011(3-10)Online publication date: Nov-2006

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