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Fundamentals of next generation compact MOSFET models

Published: 04 September 2005 Publication History

Abstract

It has recently become clear that the electronics industry is turning away from source-referenced, threshold voltage based MOSFET models. The two main approaches as candidates to replace BSIM-type models are inversion-charge and surface-potential models. This paper provides an overview of the basic physics that must be modeled to build a compact model for the MOSFET and compares the two approaches taken by the developers of next generation models.

References

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M. Miura-Mattausch, U. Feldmann, A. Rahm, M. Bollu, and D. Savignac, "Unified complete MOSFET model for analysis of digital and analog circuits," IEEE Trans. Computer-Aided Design, vol. 15, pp. 1--7, January 1996.
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C. Galup-Montoro, M. C. Schneider, and A. I. A. Cunha, "A current-based MOSFET model for integrated circuit design," Chapter 2 of Low-Voltage/Low-Power Integrated Circuits and Systems, pp 7--55, edited by E. Sanchez-Sinencio and A. Andreou, IEEE Press, 1999.
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R. van Langevelde, A. J. Scholten, and D. B. M. Klaassen, "Physical background of MOS model 11", Nat. Lab. Unclassified Report 2003/00239. April 2003. (available on line at <http://www.semiconductors.philips.com/Philips_Models/>)
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J.-M. Sallese, M. Bucher, F. Krummenacher, and P. Fazan, "Inversion charge linearization in MOSFET modeling and rigorous derivation of the EKV compact model", Solid-State Electronics vol. 47, pp. 677--683, 2003.
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    cover image ACM Conferences
    SBCCI '05: Proceedings of the 18th annual symposium on Integrated circuits and system design
    September 2005
    271 pages
    ISBN:1595931740
    DOI:10.1145/1081081
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    Publication History

    Published: 04 September 2005

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    Author Tags

    1. MOSFET model
    2. compact model
    3. inversion-charge model
    4. surface potential model

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    SBCCI05: 18th Symposium on Integrated Circuits and System Design
    September 4 - 7, 2005
    Florianolpolis, Brazil

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