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research-article

VariaSim: simulating circuits and systems in the presence of process variability

Published: 01 December 2007 Publication History

Abstract

In this paper, we present VariaSim, the publicly available Static Statistical Timing Analysis (SSTA) Tool from Duke University. VariaSim enables researchers to analyze the impact of CMOS process variability on the behavior of circuits and systems.

References

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A. Agarwal, D. Blaauw, and V. Zolotov. Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations. In Proceedings of IEEE ICCAD, pages 900--907, Nov. 2003.
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C. Amin et al. Statistical Static Timing Analysis: How Simple Can We Get? In Proceedings of the 42nd Design Automation Conference, pages 652--657, June 2005.
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H. Chang and S. S. Sapatnekar. Statistical Timing Analysis Considering Spatial Correlations Using a Single Pert-like Traversal. In Proceedings of International Conference on Computer Aided Design, pages 621--625, Nov. 2003.
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C. E. Clark. The Greatest of a Finite Set of Random Variables. Operations Research, 9(2):145--162, Mar.--Apr. 1961.
[5]
C. Visweswariah et al. First-Order Incremental Block-Based Statistical Timing Analysis. In Proceedings of the 41st Design Automation Conference, pages 331--336, June 2004.
[6]
Y. Zhan, A. J. Strojwas, X. Li, and L. T. Pileggi. Correlation-Aware Statistical Timing Analysis with Non-Gaussian Delay Distributions. In Proceedings of the 42nd Design Automation Conference, pages 77--82, June 2005.
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L. Zhang et al. Correlation-Preserved Non-Gaussian Statistical Timing Analysis with Quadratic Timing Model. In Proceedings of the 42nd Design Automation Conference, pages 83--88, June 2005.

Cited By

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  • (2016)A Survey of Architectural Techniques for Managing Process VariationACM Computing Surveys10.1145/287116748:4(1-29)Online publication date: 9-Feb-2016
  • (2008)Reducing the impact of intra-core process variability with criticality-based resource allocation and prefetchingProceedings of the 5th conference on Computing frontiers10.1145/1366230.1366257(129-138)Online publication date: 5-May-2008
  • (2008)At-speed Test Challenges for Nanometer Technology DesignsNanometer Technology Designs High-Quality Delay Tests10.1007/978-0-387-75728-5_2(29-43)Online publication date: 2008

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      Published In

      cover image ACM SIGARCH Computer Architecture News
      ACM SIGARCH Computer Architecture News  Volume 35, Issue 5
      Special issue: ALPS '07---advanced low power systems
      December 2007
      73 pages
      ISSN:0163-5964
      DOI:10.1145/1360464
      Issue’s Table of Contents

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      Association for Computing Machinery

      New York, NY, United States

      Publication History

      Published: 01 December 2007
      Published in SIGARCH Volume 35, Issue 5

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      Cited By

      View all
      • (2016)A Survey of Architectural Techniques for Managing Process VariationACM Computing Surveys10.1145/287116748:4(1-29)Online publication date: 9-Feb-2016
      • (2008)Reducing the impact of intra-core process variability with criticality-based resource allocation and prefetchingProceedings of the 5th conference on Computing frontiers10.1145/1366230.1366257(129-138)Online publication date: 5-May-2008
      • (2008)At-speed Test Challenges for Nanometer Technology DesignsNanometer Technology Designs High-Quality Delay Tests10.1007/978-0-387-75728-5_2(29-43)Online publication date: 2008

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